TREA

Sander Richard Marie Stoks

Follow

Person

  • Nijmegen, NL
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Scanning electron microscope
    • Patent number 11,024,481
    • Issue date Jun 1, 2021
    • FEI Company
    • Karel Diederick Van Der Mast
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Scanning electron microscope
    • Patent number 10,796,879
    • Issue date Oct 6, 2020
    • Phenom-World Holding B.V.
    • Karel Diederick Van Der Mast
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Sample stage
    • Patent number 10,580,613
    • Issue date Mar 3, 2020
    • Phenom-World Holding B.V.
    • Gerhardus Bernardus Stamsnijder
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    User interface for an electron microscope
    • Patent number 9,865,427
    • Issue date Jan 9, 2018
    • FEI Company
    • Martinus Petrus Maria Bierhoff
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    User interface for an electron microscope
    • Patent number 9,025,018
    • Issue date May 5, 2015
    • FEI Company
    • Martinus Petrus Maria Bierhoff
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Clustering of multi-modal data
    • Patent number 8,748,816
    • Issue date Jun 10, 2014
    • FEI Company
    • Cornelis Sander Kooijman
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroscopy technique using merged spectral data
    • Patent number 8,653,457
    • Issue date Feb 18, 2014
    • FEI Company
    • Sander Richard Marie Stoks
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE
    • Publication number 20200402760
    • Publication date Dec 24, 2020
    • Phenom-World Holding B.V.
    • Karel Diederick VAN DER MAST
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SAMPLE STAGE
    • Publication number 20190287756
    • Publication date Sep 19, 2019
    • Phenom-World Holding B.V.
    • Gerhardus Bernardus Stamsnijder
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE
    • Publication number 20190103245
    • Publication date Apr 4, 2019
    • Phenom-World Holding B.V.
    • Karel Diederick VAN DER MAST
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Sample Stage
    • Publication number 20170316913
    • Publication date Nov 2, 2017
    • Phenom-World Holding B.V.
    • Gerhardus Bernardus Stamsnijder
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    USER INTERFACE FOR AN ELECTRON MICROSCOPE
    • Publication number 20150332891
    • Publication date Nov 19, 2015
    • FEI Company
    • MART PETRUS MARIA BIERHOFF
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Spectroscopy Technique Using Merged Spectral Data
    • Publication number 20140021346
    • Publication date Jan 23, 2014
    • FEI Company
    • Sander Richard Marie Stoks
    • G01 - MEASURING TESTING
  • Information Patent Application

    CLUSTERING OF MULTI-MODAL DATA
    • Publication number 20130015351
    • Publication date Jan 17, 2013
    • FEI Company
    • Cornelis Sander Kooijman
    • G01 - MEASURING TESTING