Sandip Halder

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Heverlee, BE

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Patents Grantslast 30 patents

Information Patent Grant
Method for detecting embedded voids in a semiconductor substrate
- Patent number 8,735,182
- Issue date May 27, 2014
- IMEC
- Leonardus Leunissen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of processing and inspecting semiconductor substrates
- Patent number 8,460,946
- Issue date Jun 11, 2013
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Detecting Embedded Voids in a Semiconductor Substrate
- Publication number 20120315712
- Publication date Dec 13, 2012
- IMEC
- Leonardus Leunissen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF PROCESSING AND INSPECTING SEMICONDUCTOR SUBSTRATES
- Publication number 20120094401
- Publication date Apr 19, 2012
- IMEC
- Lars Markwort
- G01 - MEASURING TESTING
Information Patent Application
Method for Reducing the Damage Induced by a Physical Force Assisted...
- Publication number 20100224215
- Publication date Sep 9, 2010
- IMEC
- Paul Mertens
- H01 - BASIC ELECTRIC ELEMENTS