Sandip Halder

Person

Bierbeek, BE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for de-noising an electron microscope image
- Patent number 12,243,193
- Issue date Mar 4, 2025
- Imec VZW
- Bappaditya Dey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for producing a pattern of features by lithography and etching
- Patent number 10,818,504
- Issue date Oct 27, 2020
- Imec VZW
- Waikin Li
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods for detecting defects of a lithographic pattern
- Patent number 10,732,124
- Issue date Aug 4, 2020
- Imec VZW
- Sandip Halder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for verifying a pattern of features printed by a lithography...
- Patent number 10,061,209
- Issue date Aug 28, 2018
- Imec VZW
- Julien Mailfert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inspecting a pattern of features on a semiconductor die
- Patent number 9,983,154
- Issue date May 29, 2018
- Imec VZW
- Sandip Halder
- G01 - MEASURING TESTING
Information Patent Grant
Method for hotspot detection and ranking of a lithographic mask
- Patent number 9,874,821
- Issue date Jan 23, 2018
- Imec VZW
- Sandip Halder
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED DEFECT CLASSIFICATION AND DETECTION
- Publication number 20230343078
- Publication date Oct 26, 2023
- IMEC vzw
- Bappaditya Dey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER IMAGE DENOISING AND CONTOUR EXTRACTION FOR MANUFACTURING PROC...
- Publication number 20230342965
- Publication date Oct 26, 2023
- Siemens Industry Software Inc.
- Germain Louis Fenger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DE-NOISING AN ELECTRON MICROSCOPE IMAGE
- Publication number 20220076383
- Publication date Mar 10, 2022
- IMEC vzw
- Bappaditya Dey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Producing a Pattern of Features by Lithography and Etching
- Publication number 20190189458
- Publication date Jun 20, 2019
- IMEC vzw
- Waikin Li
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods for Detecting Defects of a Lithographic Pattern
- Publication number 20190079023
- Publication date Mar 14, 2019
- IMEC vzw
- Sandip Halder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Inspecting a Pattern of Features on a Semiconductor Die
- Publication number 20170167992
- Publication date Jun 15, 2017
- IMEC vzw
- Sandip Halder
- G01 - MEASURING TESTING
Information Patent Application
Method for Verifying a Pattern of Features Printed by a Lithography...
- Publication number 20170052452
- Publication date Feb 23, 2017
- IMEC vzw
- Julien Mailfert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Hotspot Detection and Ranking of a Lithographic Mask
- Publication number 20160313647
- Publication date Oct 27, 2016
- IMEC vzw
- Sandip Halder
- G01 - MEASURING TESTING

Sandip Halder

Person

Patents Grantslast 30 patents

Method for de-noising an electron microscope image

Method for producing a pattern of features by lithography and etching

Methods for detecting defects of a lithographic pattern

Method for verifying a pattern of features printed by a lithography...

Method for inspecting a pattern of features on a semiconductor die

Method for hotspot detection and ranking of a lithographic mask

Patents Applicationslast 30 patents

AUTOMATED DEFECT CLASSIFICATION AND DETECTION

WAFER IMAGE DENOISING AND CONTOUR EXTRACTION FOR MANUFACTURING PROC...

METHOD FOR DE-NOISING AN ELECTRON MICROSCOPE IMAGE

Method for Producing a Pattern of Features by Lithography and Etching

Methods for Detecting Defects of a Lithographic Pattern

Method for Inspecting a Pattern of Features on a Semiconductor Die

Method for Verifying a Pattern of Features Printed by a Lithography...

Method for Hotspot Detection and Ranking of a Lithographic Mask