Sandipan MAITY

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San Carlos, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Micromachined multi-axis gyroscopes with reduced stress sensitivity
- Patent number 11,898,845
- Issue date Feb 13, 2024
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Cenk Acar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Micromachined multi-axis gyroscopes with reduced stress sensitivity
- Patent number 11,085,766
- Issue date Aug 10, 2021
- Semiconductor Components Industries, LLC
- Cenk Acar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Accelerometer techniques to compensate package stress
- Patent number 10,697,994
- Issue date Jun 30, 2020
- Semiconductor Components Industries, LLC
- Cenk Acar
- G01 - MEASURING TESTING
Information Patent Grant
Multi-axis accelerometer with reduced stress sensitivity
- Patent number 10,393,770
- Issue date Aug 27, 2019
- Semiconductor Components Industries, LLC
- Cenk Acar
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
MICROMACHINED MULTI-AXIS GYROSCOPES WITH REDUCED STRESS SENSITIVITY
- Publication number 20210372795
- Publication date Dec 2, 2021
- Semiconductor Components Industries, LLC
- Cenk ACAR
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MULTI-AXIS GYROSCOPE WITH REDUCED BIAS DRIFT
- Publication number 20200141732
- Publication date May 7, 2020
- Semiconductor Components Industries, LLC
- Cenk ACAR
- G01 - MEASURING TESTING
Information Patent Application
MICROMACHINED MULTI-AXIS GYROSCOPES WITH REDUCED STRESS SENSITIVITY
- Publication number 20190145772
- Publication date May 16, 2019
- Semiconductor Components Industries, LLC
- Cenk ACAR
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ACCELEROMETER TECHNIQUES TO COMPENSATE PACKAGE STRESS
- Publication number 20180238925
- Publication date Aug 23, 2018
- Semiconductor Components Industries, LLC
- Cenk Acar
- G01 - MEASURING TESTING
Information Patent Application
MULTI-AXIS ACCELEROMETER WITH REDUCED STRESS SENSITIVITY
- Publication number 20170315147
- Publication date Nov 2, 2017
- Semiconductor Components Industries, LLC
- Cenk ACAR
- G01 - MEASURING TESTING