Sang Heon Ye

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Busan, KR

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Patents Grantslast 30 patents

Information Patent Grant
Focused-beam ellipsometer
- Patent number 8,004,677
- Issue date Aug 23, 2011
- Korea Research Institute of Standards and Science
- Joong Whan Lee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Focused-beam ellipsometer
- Publication number 20100045985
- Publication date Feb 25, 2010
- Joong Whan Lee
- G01 - MEASURING TESTING