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Pleasanton, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Electron microscope and specimen contamination prevention method
Patent number
12,131,881
Issue date
Oct 29, 2024
Jeol Ltd.
Takeshi Kaneko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Arbitrary electron dose waveforms for electron microscopy
Patent number
12,080,514
Issue date
Sep 3, 2024
INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
Ruth Shewmon Bloom
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High framerate and high dynamic range electron microscopy
Patent number
11,804,359
Issue date
Oct 31, 2023
INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
Ruth Bloom
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Arbitrary electron dose waveforms for electron microscopy
Patent number
11,728,128
Issue date
Aug 15, 2023
INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
Ruth Shewmon Bloom
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Arbitrary electron dose waveforms for electron microscopy
Patent number
11,476,082
Issue date
Oct 18, 2022
INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
Ruth Shewmon Bloom
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
HIGH FRAMERATE AND HIGH DYNAMIC RANGE ELECTRON MICROSCOPY
Publication number
20240105418
Publication date
Mar 28, 2024
Integrated Dynamic Electron Solutions, Inc.
Ruth BLOOM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY
Publication number
20230411112
Publication date
Dec 21, 2023
Integrated Dynamic Electron Solutions, Inc.
Ruth Shewmon BLOOM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY
Publication number
20220406561
Publication date
Dec 22, 2022
Integrated Dynamic Electron Solutions, Inc.
Ruth Shewmon BLOOM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY
Publication number
20220336185
Publication date
Oct 20, 2022
Integrated Dynamic Electron Solutions, Inc.
Ruth Shewmon BLOOM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron Microscope and Specimen Contamination Prevention Method
Publication number
20220328280
Publication date
Oct 13, 2022
JEOL Ltd.
Takeshi Kaneko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH FRAMERATE AND HIGH DYNAMIC RANGE ELECTRON MICROSCOPY
Publication number
20210082661
Publication date
Mar 18, 2021
Integrated Dynamic Electron Solutions, Inc.
Ruth BLOOM
H01 - BASIC ELECTRIC ELEMENTS