Sang-Wook WEE

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Gyeongsangbuk-Do, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method of identifying crystal defect region in monocrystalline sili...
- Patent number 7,901,132
- Issue date Mar 8, 2011
- Siltron Inc.
- Sang-Wook Wee
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF IDENTIFYING CRYSTAL DEFECT REGION IN MONOCRYSTALLINE SILI...
- Publication number 20080075138
- Publication date Mar 27, 2008
- Sang-Wook WEE
- G01 - MEASURING TESTING