Sangdon Jang

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Ansan-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Measuring system and measuring method
- Patent number 9,874,435
- Issue date Jan 23, 2018
- Samsung Electronics Co., Ltd.
- Sangwook Park
- G01 - MEASURING TESTING
Information Patent Grant
Optical apparatus and manufacturing method using the same
- Patent number 9,690,200
- Issue date Jun 27, 2017
- Samsung Electronics Co., Ltd.
- Sangjoon Hong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SUPPORTING UNIT AND SUBSTRATE-TREATING APPARATUS INCLUDING THE SAME
- Publication number 20160375534
- Publication date Dec 29, 2016
- Samsung Electronics Co., Ltd.
- Sang-Hyun PARK
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL APPARATUS AND MANUFACTURING METHOD USING THE SAME
- Publication number 20160097981
- Publication date Apr 7, 2016
- KNU-INDUSTRY COOPERATION FOUNDATION
- SANGJOON HONG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MEASURING SYSTEM AND MEASURING METHOD
- Publication number 20150338206
- Publication date Nov 26, 2015
- Samsung Electronics Co., Ltd.
- Sangwook PARK
- G01 - MEASURING TESTING
Information Patent Application
Maskless lithographic apparatus and methods of compensation for rot...
- Publication number 20100060874
- Publication date Mar 11, 2010
- SAMSUNG ELECTRONICS CO., LTD.
- Jeongmin Kim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY