Sangkil LEE

Person

Yongin-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Fusion memory device and method of fabricating the same
- Patent number 12,119,336
- Issue date Oct 15, 2024
- Samsung Electronics Co., Ltd.
- Hyunmog Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor package
- Patent number 11,955,458
- Issue date Apr 9, 2024
- Samsung Electronics Co., Ltd.
- Sangkil Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device having volatile and non-volatile memory cells
- Patent number 11,922,984
- Issue date Mar 5, 2024
- Samsung Electronics Co., Ltd.
- Minhee Cho
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor package
- Patent number 11,688,719
- Issue date Jun 27, 2023
- Samsung Electronics Co., Ltd.
- Sangkil Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device
- Patent number 11,482,267
- Issue date Oct 25, 2022
- Samsung Electronics Co., Ltd.
- Minhee Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fusion memory device and method of fabricating the same
- Patent number 11,462,528
- Issue date Oct 4, 2022
- Samsung Electronics Co., Ltd.
- Hyunmog Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor package
- Patent number 11,251,155
- Issue date Feb 15, 2022
- Samsung Electronics Co., Ltd.
- Sangkil Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device
- Patent number 11,062,751
- Issue date Jul 13, 2021
- Samsung Electronics Co., Ltd.
- Minhee Cho
- G11 - INFORMATION STORAGE
Information Patent Grant
Mass flow controller, apparatus for manufacturing semiconductor dev...
- Patent number 10,845,232
- Issue date Nov 24, 2020
- Samsung Electronics Co., Ltd.
- Sangkil Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a semiconductor device using semiconductor...
- Patent number 9,583,402
- Issue date Feb 28, 2017
- Samsung Electronics Co., Ltd.
- Sung Yoon Ryu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of inspecting semiconductor device and method of fabricating...
- Patent number 9,466,537
- Issue date Oct 11, 2016
- Samsung Electronics Co., Ltd.
- Minkook Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection system and methods of inspecting a semicon...
- Patent number 9,455,121
- Issue date Sep 27, 2016
- Samsung Electronics Co., Ltd.
- Hyunwoo Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatuses for inspecting semiconductor devices using...
- Patent number 9,267,903
- Issue date Feb 23, 2016
- Samsung Electronics Co., Ltd.
- Mira Park
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICE
- Publication number 20240249788
- Publication date Jul 25, 2024
- Samsung Electronics Co., Ltd.
- Jungmin Bak
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor Memory Device
- Publication number 20230309317
- Publication date Sep 28, 2023
- Samsung Electronics Co., Ltd.
- Hyuncheol KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGE
- Publication number 20230290754
- Publication date Sep 14, 2023
- Samsung Electronics Co., Ltd.
- Sangkil LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY SYSTEM FOR BACKING UP DATA IN CASE OF SUDDEN POWER-OFF AND O...
- Publication number 20230152985
- Publication date May 18, 2023
- Samsung Electronics Co., Ltd.
- SANGKIL LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE
- Publication number 20230021071
- Publication date Jan 19, 2023
- Samsung Electronics Co., Ltd.
- Minhee CHO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FUSION MEMORY DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20220384410
- Publication date Dec 1, 2022
- Samsung Electronics Co., Ltd.
- Hyunmog Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGE
- Publication number 20220139875
- Publication date May 5, 2022
- Samsung Electronics Co., Ltd.
- Sangkil LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE
- Publication number 20210280230
- Publication date Sep 9, 2021
- Samsung Electronics Co., Ltd.
- Minhee CHO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE
- Publication number 20200388313
- Publication date Dec 10, 2020
- Samsung Electronics Co., Ltd.
- Minhee CHO
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR PACKAGE
- Publication number 20200381393
- Publication date Dec 3, 2020
- Samsung Electronics Co., Ltd.
- Sangkil LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FUSION MEMORY DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20200203328
- Publication date Jun 25, 2020
- Samsung Electronics Co., Ltd.
- Hyunmog Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS FLOW CONTROLLER, APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEV...
- Publication number 20190170563
- Publication date Jun 6, 2019
- Samsung Electronics Co., Ltd.
- Sangkil Lee
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF INSPECTING SUBSTRATES AND SEMICONDUCTOR FABRICATION METH...
- Publication number 20170200658
- Publication date Jul 13, 2017
- Samsung Electronics Co., Ltd.
- Yusin Yang
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING...
- Publication number 20160204041
- Publication date Jul 14, 2016
- Samsung Electronics Co., Ltd.
- Minkook KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTION SYSTEM AND METHODS OF INSPECTING A SEMICON...
- Publication number 20160086769
- Publication date Mar 24, 2016
- Hyunwoo KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING SEMICONDUCTOR...
- Publication number 20160027707
- Publication date Jan 28, 2016
- Samsung Electronics Co., Ltd.
- Sung Yoon RYU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND APPARATUSES FOR INSPECTING SEMICONDUCTOR DEVICES USING...
- Publication number 20140061462
- Publication date Mar 6, 2014
- Mira PARK
- G01 - MEASURING TESTING

Sangkil LEE

Person

Patents Grantslast 30 patents

Fusion memory device and method of fabricating the same

Semiconductor package

Memory device having volatile and non-volatile memory cells

Semiconductor package

Memory device

Fusion memory device and method of fabricating the same

Semiconductor package

Memory device

Mass flow controller, apparatus for manufacturing semiconductor dev...

Method of manufacturing a semiconductor device using semiconductor...

Method of inspecting semiconductor device and method of fabricating...

Semiconductor inspection system and methods of inspecting a semicon...

Methods and apparatuses for inspecting semiconductor devices using...

Patents Applicationslast 30 patents

MEMORY DEVICE

Semiconductor Memory Device

SEMICONDUCTOR PACKAGE

MEMORY SYSTEM FOR BACKING UP DATA IN CASE OF SUDDEN POWER-OFF AND O...

MEMORY DEVICE

FUSION MEMORY DEVICE AND METHOD OF FABRICATING THE SAME

SEMICONDUCTOR PACKAGE

MEMORY DEVICE

MEMORY DEVICE

SEMICONDUCTOR PACKAGE

FUSION MEMORY DEVICE AND METHOD OF FABRICATING THE SAME

MASS FLOW CONTROLLER, APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEV...

METHODS OF INSPECTING SUBSTRATES AND SEMICONDUCTOR FABRICATION METH...

METHOD OF INSPECTING SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING...

SEMICONDUCTOR INSPECTION SYSTEM AND METHODS OF INSPECTING A SEMICON...

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING SEMICONDUCTOR...

METHODS AND APPARATUSES FOR INSPECTING SEMICONDUCTOR DEVICES USING...