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Sangmuk OH
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Gyeonggi-do, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device and test method thereof
Patent number
11,495,498
Issue date
Nov 8, 2022
SK Hynix Inc.
Jihwan Kim
G01 - MEASURING TESTING
Information
Patent Grant
Stacked semiconductor device and test method thereof
Patent number
11,456,283
Issue date
Sep 27, 2022
SK Hynix Inc.
Sangmuk Oh
G01 - MEASURING TESTING
Information
Patent Grant
Stacked semiconductor device and test method thereof
Patent number
11,156,657
Issue date
Oct 26, 2021
SK Hynix Inc.
Sangmuk Oh
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
STACKED SEMICONDUCTOR DEVICE AND TEST METHOD THEREOF
Publication number
20210190854
Publication date
Jun 24, 2021
SK hynix Inc.
Sangmuk OH
G01 - MEASURING TESTING
Information
Patent Application
STACKED SEMICONDUCTOR DEVICE AND TEST METHOD THEREOF
Publication number
20210193623
Publication date
Jun 24, 2021
SK hynix Inc.
Sangmuk OH
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND TEST METHOD THEREOF
Publication number
20210193525
Publication date
Jun 24, 2021
SK HYNIX INC.
Jihwan KIM
G01 - MEASURING TESTING