Sangsik Lee

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Suwon-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Pressurizing device for semiconductor testing and semiconductor tes...
- Patent number 12,313,677
- Issue date May 27, 2025
- Samsung Electronics Co., Ltd.
- Changgeun Yang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PRESSURIZING DEVICE FOR SEMICONDUCTOR TESTING AND SEMICONDUCTOR TES...
- Publication number 20230221366
- Publication date Jul 13, 2023
- Samsung Electronics Co., Ltd.
- Changgeun YANG
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET, TEST APPARATUS WITH TEST SOCKET
- Publication number 20100164525
- Publication date Jul 1, 2010
- Samsung Electronics Co., Ltd.
- Jongwong HAN
- G01 - MEASURING TESTING