SANGSOON IM

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Test circuit using clock gating scheme to hold capture procedure an...
- Patent number 11,959,965
- Issue date Apr 16, 2024
- Samsung Electronics Co., Ltd.
- Giha Nam
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LOGIC BIST CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING SAME
- Publication number 20240426909
- Publication date Dec 26, 2024
- SAMSUNG ELECTRONICS CO,. LTD.
- Sangsoon IM
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT USING CLOCK GATING SCHEME TO HOLD CAPTURE PROCEDURE AN...
- Publication number 20230152372
- Publication date May 18, 2023
- Samsung Electronics Co., Ltd.
- GIHA NAM
- G01 - MEASURING TESTING