Sangwoo Bae

Person

Seoul, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Polarization measuring device and method of fabricating semiconduct...
- Patent number 11,946,809
- Issue date Apr 2, 2024
- Samsung Electronics Co., Ltd.
- Ingi Kim
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection apparatus and system including the same
- Patent number 11,823,927
- Issue date Nov 21, 2023
- Samsung Electronics Co., Ltd.
- Kyunghun Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate inspection system and method of manufacturing semiconduct...
- Patent number 11,823,961
- Issue date Nov 21, 2023
- Samsung Electronics Co., Ltd.
- Eunhee Jeang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical test system and method, and method of manufacturing semicon...
- Patent number 10,401,301
- Issue date Sep 3, 2019
- Samsung Electronics Co., Ltd.
- Seongkeun Cho
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE INSPECTION SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCT...
- Publication number 20240145315
- Publication date May 2, 2024
- Samsung Electronics Co., Ltd.
- EUNHEE JEANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME
- Publication number 20240118072
- Publication date Apr 11, 2024
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE, DIE BONDING SYSTEM, AND DIE BONDING METHOD
- Publication number 20240105524
- Publication date Mar 28, 2024
- Samsung Electronics Co., Ltd.
- Hyungjin KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE AND INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20240019362
- Publication date Jan 18, 2024
- Samsung Electronics Co., Ltd.
- Junbum Park
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ASSEMBLY FOR PARALLELISM MEASUREMENT, OPTICAL APPARATUS INC...
- Publication number 20230392925
- Publication date Dec 7, 2023
- Samsung Electronics Co., Ltd.
- Jiyoung Chu
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION MEASURING DEVICE AND METHOD OF FABRICATING SEMICONDUCT...
- Publication number 20230068376
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- Ingi KIM
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE INSPECTION DEVICE BASED ON SPATIAL MODULATION METHOD AND P...
- Publication number 20220120662
- Publication date Apr 21, 2022
- Samsung Electronics Co., Ltd.
- Sangwoo BAE
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION APPARATUS AND SYSTEM INCLUDING THE SAME
- Publication number 20220068681
- Publication date Mar 3, 2022
- Samsung Electronics Co., Ltd.
- Kyunghun Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTION SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCT...
- Publication number 20210305106
- Publication date Sep 30, 2021
- Samsung Electronics Co., Ltd.
- EUNHEE JEANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL TEST SYSTEM AND METHOD, AND METHOD OF MANUFACTURING SEMICON...
- Publication number 20190113463
- Publication date Apr 18, 2019
- Samsung Electronics Co., Ltd.
- Seongkeun CHO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Maskless lithographic apparatus and methods of compensation for rot...
- Publication number 20100060874
- Publication date Mar 11, 2010
- SAMSUNG ELECTRONICS CO., LTD.
- Jeongmin Kim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Sangwoo Bae

Person

Patents Grantslast 30 patents

Polarization measuring device and method of fabricating semiconduct...

Wafer inspection apparatus and system including the same

Substrate inspection system and method of manufacturing semiconduct...

Optical test system and method, and method of manufacturing semicon...

Patents Applicationslast 30 patents

SUBSTRATE INSPECTION SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCT...

LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME

OPTICAL DEVICE, DIE BONDING SYSTEM, AND DIE BONDING METHOD

PROBE AND INSPECTION APPARATUS INCLUDING THE SAME

OPTICAL ASSEMBLY FOR PARALLELISM MEASUREMENT, OPTICAL APPARATUS INC...

POLARIZATION MEASURING DEVICE AND METHOD OF FABRICATING SEMICONDUCT...

PARTICLE INSPECTION DEVICE BASED ON SPATIAL MODULATION METHOD AND P...

WAFER INSPECTION APPARATUS AND SYSTEM INCLUDING THE SAME

SUBSTRATE INSPECTION SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCT...

OPTICAL TEST SYSTEM AND METHOD, AND METHOD OF MANUFACTURING SEMICON...

Maskless lithographic apparatus and methods of compensation for rot...