Sanichiro Yoshida

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Hammond, LA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for analyzing deformation and predicting failu...
- Patent number 7,512,502
- Issue date Mar 31, 2009
- Southeastern Louisiana University
- Sanichiro Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Method for resolving phase in electronic speckle interferometry
- Patent number 7,280,187
- Issue date Oct 9, 2007
- Southeastern Louisiana University
- Sanichiro Yoshida
- G01 - MEASURING TESTING