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Tokyo, JP
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last 30 patents
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Patent Grant
Electro-optic probe and magneto-optic probe
Patent number
6,624,644
Issue date
Sep 23, 2003
Ando Electric Co., Ltd.
Akishige Ito
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Electro-optic probe and magneto-optic probe
Publication number
20020008533
Publication date
Jan 24, 2002
ANDO ELECTRIC CO., LTD.
Akishige Ito
G01 - MEASURING TESTING
Information
Patent Application
Probe signal outputting apparatus
Publication number
20010022338
Publication date
Sep 20, 2001
Yoshiki Yanagisawa
G01 - MEASURING TESTING
Information
Patent Application
Probe signal outputting apparatus
Publication number
20010022339
Publication date
Sep 20, 2001
Yoshiki Yanagisawa
G01 - MEASURING TESTING