Sanjay Kapasi

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Process-sensitive metrology systems and methods
- Patent number 10,216,096
- Issue date Feb 26, 2019
- KLA-Tencor Corporation
- Myungjun Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Model-based hot spot monitoring
- Patent number 10,030,965
- Issue date Jul 24, 2018
- KLA-Tencor Corporation
- Stilian Ivanov Pandev
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Process-Sensitive Metrology Systems and Methods
- Publication number 20170045826
- Publication date Feb 16, 2017
- KLA-Tencor Corporation
- Myungjun Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Model-Based Hot Spot Monitoring
- Publication number 20160327605
- Publication date Nov 10, 2016
- KLA-Tencor Corporation
- Stilian Ivanov Pandev
- G01 - MEASURING TESTING