Sanjay Lalbahadoersing

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Helmond, NL

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Patents Grantslast 30 patents

Information Patent Grant
Marker structure for optical alignment of a substrate, a substrate...
- Patent number 7,619,738
- Issue date Nov 17, 2009
- ASML Netherlands B.V.
- Richard Johannes Franciscus Van Haren
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for measuring information about a substrate, and a substrate...
- Patent number 7,355,675
- Issue date Apr 8, 2008
- ASML Netherlands B.V.
- Sanjay Lalbahadoersing
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Marker structure for optical alignment of a substrate, a substrate...
- Patent number 7,330,261
- Issue date Feb 12, 2008
- ASML Netherlands B.V.
- Richard Johannes Franciscus Van Haren
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Marker structure for optical alignment of a substrate, a substrate...
- Publication number 20080180668
- Publication date Jul 31, 2008
- ASML NETHERLANDS B.V.
- Richard Johannes Franciscus Van Haren
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for measuring information about a substrate, and a substrate...
- Publication number 20060138410
- Publication date Jun 29, 2006
- ASML NETHERLANDS B.V.
- Sanjay Lalbahadoersing
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Marker structure for optical alignment of a substrate, a substrate...
- Publication number 20040114143
- Publication date Jun 17, 2004
- ASML NETHERLANDS B.V.
- Richard Johannes Franciscus Van Haren
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY