Sanjay Rajaram

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Front surface and back surface orientation detection of transparent...
- Patent number 11,728,191
- Issue date Aug 15, 2023
- Applied Materials, Inc.
- Michelle Alejandra Wong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate processing systems, apparatus, and methods with factory i...
- Patent number 11,450,539
- Issue date Sep 20, 2022
- Applied Materials, Inc.
- Sushant S. Koshti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate processing systems, apparatus, and methods with factory i...
- Patent number 11,282,724
- Issue date Mar 22, 2022
- Applied Materials, Inc.
- Sushant S. Koshti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate processing systems, apparatus, and methods with factory i...
- Patent number 10,192,765
- Issue date Jan 29, 2019
- Applied Materials, Inc.
- Sushant S. Koshti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computer-implemented process control in chemical mechanical polishing
- Patent number 8,460,057
- Issue date Jun 11, 2013
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing system with in-line and in-situ metrology
- Patent number 7,927,182
- Issue date Apr 19, 2011
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Grant
Computer-implemented method for process control in chemical mechani...
- Patent number 7,585,202
- Issue date Sep 8, 2009
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing system with in-line and in-situ metrology
- Patent number 7,294,039
- Issue date Nov 13, 2007
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing system with in-line and in-situ metrology
- Patent number 7,101,251
- Issue date Sep 5, 2006
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing system with in-line and in-situ metrology
- Patent number 6,939,198
- Issue date Sep 6, 2005
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE PROCESSING SYSTEMS, APPARATUS, AND METHODS WITH FACTORY I...
- Publication number 20220392789
- Publication date Dec 8, 2022
- Applied Materials, Inc.
- Sushant S. Koshti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FRONT SURFACE AND BACK SURFACE ORIENTATION DETECTION OF TRANSPARENT...
- Publication number 20210351050
- Publication date Nov 11, 2021
- Applied Materials, Inc.
- Michelle Alejandra Wong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE PROCESSING SYSTEMS, APPARATUS, AND METHODS WITH FACTORY I...
- Publication number 20190362997
- Publication date Nov 28, 2019
- Applied Materials, Inc.
- Sushant S. Koshti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE PROCESSING SYSTEMS, APPARATUS, AND METHODS WITH FACTORY I...
- Publication number 20180366355
- Publication date Dec 20, 2018
- Applied Materials, Inc.
- Sushant S. Koshti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE PROCESSING SYSTEMS, APPARATUS, AND METHODS WITH FACTORY I...
- Publication number 20150045961
- Publication date Feb 12, 2015
- Applied Materials, Inc.
- Sushant S. Koshti
- G05 - CONTROLLING REGULATING
Information Patent Application
POLISHING SYSTEM WITH IN-LINE AND IN-SITU METROLOGY
- Publication number 20110195528
- Publication date Aug 11, 2011
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Application
POLISHING SYSTEM WITH IN-LINE AND IN-SITU METROLOGY
- Publication number 20100062684
- Publication date Mar 11, 2010
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Application
Polishing System With In-Line and In-Situ Metrology
- Publication number 20080064300
- Publication date Mar 13, 2008
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Application
Polishing System With In-Line and In-Situ Metrology
- Publication number 20060286904
- Publication date Dec 21, 2006
- Applied Materials, Inc.
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING
Information Patent Application
Polishing system with in-line and in-situ metrology
- Publication number 20050245170
- Publication date Nov 3, 2005
- Applied Materials, Inc., a Delaware corporation
- Boguslaw A. Swedek
- B24 - GRINDING POLISHING

Sanjay Rajaram

Person

Patents Grantslast 30 patents

Front surface and back surface orientation detection of transparent...

Substrate processing systems, apparatus, and methods with factory i...

Substrate processing systems, apparatus, and methods with factory i...

Substrate processing systems, apparatus, and methods with factory i...

Computer-implemented process control in chemical mechanical polishing

Polishing system with in-line and in-situ metrology

Computer-implemented method for process control in chemical mechani...

Polishing system with in-line and in-situ metrology

Polishing system with in-line and in-situ metrology

Polishing system with in-line and in-situ metrology

Patents Applicationslast 30 patents

SUBSTRATE PROCESSING SYSTEMS, APPARATUS, AND METHODS WITH FACTORY I...

FRONT SURFACE AND BACK SURFACE ORIENTATION DETECTION OF TRANSPARENT...

SUBSTRATE PROCESSING SYSTEMS, APPARATUS, AND METHODS WITH FACTORY I...

SUBSTRATE PROCESSING SYSTEMS, APPARATUS, AND METHODS WITH FACTORY I...

SUBSTRATE PROCESSING SYSTEMS, APPARATUS, AND METHODS WITH FACTORY I...

POLISHING SYSTEM WITH IN-LINE AND IN-SITU METROLOGY

POLISHING SYSTEM WITH IN-LINE AND IN-SITU METROLOGY

Polishing System With In-Line and In-Situ Metrology

Polishing System With In-Line and In-Situ Metrology

Polishing system with in-line and in-situ metrology