Sanjeev Grover

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for massively parallel multi-wafer test
- Patent number 9,335,347
- Issue date May 10, 2016
- Advantest Corporation
- John W. Andberg
- G01 - MEASURING TESTING
Information Patent Grant
Test electronics to device under test interfaces, and methods and a...
- Patent number 8,354,853
- Issue date Jan 15, 2013
- Advantest (Singapore) Pte Ltd
- Sanjeev Grover
- G01 - MEASURING TESTING
Information Patent Grant
System, method and apparatus using at least one flex circuit to con...
- Patent number 7,717,715
- Issue date May 18, 2010
- Verigy (Singapore) Pte. Ltd.
- Sanjeev Grover
- G01 - MEASURING TESTING
Information Patent Grant
Screw-less latching system for securing load boards
- Patent number 7,696,744
- Issue date Apr 13, 2010
- Verigy(Singapore) Pte. Ltd.
- Todd James Sholl
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR MASSIVELY PARALLEL MULTI-WAFER TEST
- Publication number 20140070828
- Publication date Mar 13, 2014
- John W. Andberg
- G01 - MEASURING TESTING
Information Patent Application
TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND A...
- Publication number 20130135002
- Publication date May 30, 2013
- ADVANTEST (SINGAPORE) PTE LTD
- Sanjeev Grover
- G01 - MEASURING TESTING
Information Patent Application
TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND A...
- Publication number 20100134134
- Publication date Jun 3, 2010
- Verigy (Singapore) Pte. Ltd.
- Sanjeev Grover
- G01 - MEASURING TESTING
Information Patent Application
Screw-less latching system for securing load boards
- Publication number 20090141463
- Publication date Jun 4, 2009
- Todd James Sholl
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Right Angle Connection System for ATE Interface
- Publication number 20080233769
- Publication date Sep 25, 2008
- Sanjeev Grover
- G01 - MEASURING TESTING