Sanjeev Mathur

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Irving, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for inspection using white light interferometry
- Patent number 7,158,235
- Issue date Jan 2, 2007
- Rudolph Technologies, Inc.
- Sanjeev Mathur
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspection using off-angle lighting
- Patent number 7,024,031
- Issue date Apr 4, 2006
- August Technology Corp.
- Ramiro Castellanos-Nolasco
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting a component using interferometry
- Patent number 7,019,841
- Issue date Mar 28, 2006
- August Technology Corp.
- Sanjeev Mathur
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and method for inspection using white light intererometry
- Publication number 20040090634
- Publication date May 13, 2004
- Sanjeev Mathur
- G01 - MEASURING TESTING