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Sanjiv Stokes
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Los Altos, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Shielded wire arrangement for die testing
Patent number
9,412,674
Issue date
Aug 9, 2016
Xilinx, Inc.
Myongseob Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Capacitors within an interposer coupled to supply and ground planes...
Patent number
9,337,138
Issue date
May 10, 2016
Xilinx, Inc.
Khaldoon S. Abugharbieh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor component having test pads and method and apparatus f...
Patent number
7,737,439
Issue date
Jun 15, 2010
Xilinx, Inc.
Mohsen Hossein Mardi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Semiconductor component having test pads and method and apparatus f...
Patent number
7,235,412
Issue date
Jun 26, 2007
Xilinx, Inc.
Mohsen Hossein Mardi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Integrated circuit interconnect structure having reduced coupling b...
Patent number
7,199,610
Issue date
Apr 3, 2007
Xilinx, Inc.
Steven P. Young
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
Semiconductor component having test pads and method and apparatus f...
Publication number
20070221920
Publication date
Sep 27, 2007
Xilinx, Inc.
Mohsen Hossein Mardi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Semiconductor component having test pads and method and apparatus f...
Publication number
20070218573
Publication date
Sep 20, 2007
Xilinx, Inc.
Mohsen Hossein Mardi
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR