Sankar Venkataraman

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Accelerated training of a machine learning based model for semicond...
- Patent number 11,580,375
- Issue date Feb 14, 2023
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor inspection and metrology systems for distributing job...
- Patent number 11,237,872
- Issue date Feb 1, 2022
- KLA-Tencor Corporation
- Ajay Gupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Training a machine learning model with synthetic images
- Patent number 11,170,255
- Issue date Nov 9, 2021
- KLA-Tencor Corp.
- Ian Riley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semi-supervised anomaly detection in scanning electron microscope i...
- Patent number 10,789,703
- Issue date Sep 29, 2020
- KLA-Tencor Corporation
- Shaoyu Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Unified neural network for defect detection and classification
- Patent number 10,607,119
- Issue date Mar 31, 2020
- KLA-Tencor Corp.
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for defect classification
- Patent number 10,482,590
- Issue date Nov 19, 2019
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Contour based defect detection
- Patent number 10,395,362
- Issue date Aug 27, 2019
- KLA-Tencor Corp.
- Ajay Gupta
- G01 - MEASURING TESTING
Information Patent Grant
Single image detection
- Patent number 10,186,026
- Issue date Jan 22, 2019
- KLA-Tencor Corp.
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for iterative defect classification
- Patent number 9,922,269
- Issue date Mar 20, 2018
- KLA-Tencor Corporation
- Sankar Venkataraman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for defect classification
- Patent number 9,898,811
- Issue date Feb 20, 2018
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive nuisance filter
- Patent number 9,835,566
- Issue date Dec 5, 2017
- KLA-Tencor Corp.
- Ardis Liang
- G01 - MEASURING TESTING
Information Patent Grant
Contour-based defect detection using an inspection apparatus
- Patent number 8,669,523
- Issue date Mar 11, 2014
- KLA-Tencor Corporation
- Chien-Huei Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERPRETABLE DEEP LEARNING-BASED DEFECT DETECTION AND CLASSIFICATION
- Publication number 20220101114
- Publication date Mar 31, 2022
- KLA Corporation
- Xu Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRAINING A MACHINE LEARNING MODEL WITH SYNTHETIC IMAGES
- Publication number 20190294923
- Publication date Sep 26, 2019
- KLA-Tencor Corporation
- Ian Riley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMI-SUPERVISED ANOMALY DETECTION IN SCANNING ELECTRON MICROSCOPE I...
- Publication number 20190287230
- Publication date Sep 19, 2019
- KLA-Tencor Corporation
- Shaoyu Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
UNIFIED NEURAL NETWORK FOR DEFECT DETECTION AND CLASSIFICATION
- Publication number 20190073568
- Publication date Mar 7, 2019
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scalable and Flexible Job Distribution Architecture for a Hybrid Pr...
- Publication number 20180341525
- Publication date Nov 29, 2018
- KLA-Tencor Corporation
- Ajay Gupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTOUR BASED DEFECT DETECTION
- Publication number 20180293721
- Publication date Oct 11, 2018
- KLA-Tencor Corporation
- Ajay Gupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Defect Classification
- Publication number 20180114310
- Publication date Apr 26, 2018
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACCELERATED TRAINING OF A MACHINE LEARNING BASED MODEL FOR SEMICOND...
- Publication number 20170193400
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SINGLE IMAGE DETECTION
- Publication number 20170140524
- Publication date May 18, 2017
- KLA-Tencor Corporation
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Iterative Defect Classification
- Publication number 20160358041
- Publication date Dec 8, 2016
- KLA-Tencor Corporation
- Sankar Venkataraman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Defect Classification
- Publication number 20160328837
- Publication date Nov 10, 2016
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Adaptive Nuisance Filter
- Publication number 20160258879
- Publication date Sep 8, 2016
- KLA-Tencor Corporation
- Ardis Liang
- G01 - MEASURING TESTING
Information Patent Application
CONTOUR-BASED DEFECT DETECTION USING AN INSPECTION APPARATUS
- Publication number 20120298862
- Publication date Nov 29, 2012
- Chien-Huei CHEN
- G06 - COMPUTING CALCULATING COUNTING

Sankar Venkataraman

Person

Patents Grantslast 30 patents

Accelerated training of a machine learning based model for semicond...

Semiconductor inspection and metrology systems for distributing job...

Training a machine learning model with synthetic images

Semi-supervised anomaly detection in scanning electron microscope i...

Unified neural network for defect detection and classification

Method and system for defect classification

Contour based defect detection

Single image detection

Method and system for iterative defect classification

Method and system for defect classification

Adaptive nuisance filter

Contour-based defect detection using an inspection apparatus

Patents Applicationslast 30 patents

INTERPRETABLE DEEP LEARNING-BASED DEFECT DETECTION AND CLASSIFICATION

TRAINING A MACHINE LEARNING MODEL WITH SYNTHETIC IMAGES

SEMI-SUPERVISED ANOMALY DETECTION IN SCANNING ELECTRON MICROSCOPE I...

UNIFIED NEURAL NETWORK FOR DEFECT DETECTION AND CLASSIFICATION

Scalable and Flexible Job Distribution Architecture for a Hybrid Pr...

CONTOUR BASED DEFECT DETECTION

Method and System for Defect Classification

ACCELERATED TRAINING OF A MACHINE LEARNING BASED MODEL FOR SEMICOND...

SINGLE IMAGE DETECTION

Method and System for Iterative Defect Classification

Method and System for Defect Classification

Adaptive Nuisance Filter

CONTOUR-BASED DEFECT DETECTION USING AN INSPECTION APPARATUS