Santiago Echeverri

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Copenhagen, DK

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Patents Grantslast 30 patents

Information Patent Grant
Intelligent wafer-level testing of photonic devices
- Patent number 12,174,238
- Issue date Dec 24, 2024
- Mellanox Technologies, Ltd.
- Amir Silber
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR ALIGNING AN OPTICAL CONNECTOR WITH AN OPTICAL COMPONENT
- Publication number 20250189734
- Publication date Jun 12, 2025
- Mellanox Technologes, Ltd.
- Hassid C. Gurgov
- G02 - OPTICS
Information Patent Application
Intelligent Wafer-Level Testing of Photonic Devices
- Publication number 20230063481
- Publication date Mar 2, 2023
- MELLANOX TECHNOLOGIES, LTD.
- Amir Silber
- G01 - MEASURING TESTING