Santokh Singh Bhadare

Person

  • Middlesex, GB

Patents Grantslast 30 patents

  • Information Patent Grant

    Sample inspection apparatus

    • Patent number 7,151,269
    • Issue date Dec 19, 2006
    • Oxford Instruments Analytical Ltd.
    • Santokh Singh Bhadare
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Detection system

    • Patent number 6,573,509
    • Issue date Jun 3, 2003
    • Oxford Instruments Analytical Limited
    • Ian Radley
    • F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...

Patents Applicationslast 30 patents

  • Information Patent Application

    X-RAY ANALYSER

    • Publication number 20120273679
    • Publication date Nov 1, 2012
    • OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD
    • Angus Bewick
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    X-RAY DETECTOR AND METHOD

    • Publication number 20070114429
    • Publication date May 24, 2007
    • OXFORD INSTRUMENTS ANALYTICAL LIMITED
    • Santokh Singh Bhadare
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sample inspection apparatus

    • Publication number 20060255290
    • Publication date Nov 16, 2006
    • Oxford Instruments Analytical Limited
    • Santokh Singh Bhadare
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Detection system

    • Publication number 20020117628
    • Publication date Aug 29, 2002
    • Ian Radley
    • G01 - MEASURING TESTING