Santosh Bhattacharyya

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
BBP assisted defect detection flow for SEM images
- Patent number 11,450,012
- Issue date Sep 20, 2022
- KLA Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for difference filter and aperture selection usin...
- Patent number 11,151,707
- Issue date Oct 19, 2021
- KLA Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect-location determination using correction loop for pixel align...
- Patent number 11,049,745
- Issue date Jun 29, 2021
- KLA Corporation
- David Dowling
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect discovery and recipe optimization for inspection of three-di...
- Patent number 11,047,806
- Issue date Jun 29, 2021
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
And noise based care areas
- Patent number 10,832,396
- Issue date Nov 10, 2020
- KLA-Tencor Corp.
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High sensitivity repeater defect detection
- Patent number 10,395,358
- Issue date Aug 27, 2019
- KLA-Tencor Corp.
- Bjorn Brauer
- G01 - MEASURING TESTING
Information Patent Grant
System, method and computer program product for automatically gener...
- Patent number 10,325,361
- Issue date Jun 18, 2019
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combined patch and design-based defect detection
- Patent number 10,192,302
- Issue date Jan 29, 2019
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection for specimens with extensive die to die process variation
- Patent number 10,151,706
- Issue date Dec 11, 2018
- KLA-Tencor Corp.
- Santosh Bhattacharyya
- G01 - MEASURING TESTING
Information Patent Grant
Defect sensitivity of semiconductor wafer inspectors using design d...
- Patent number 10,127,651
- Issue date Nov 13, 2018
- KLA-Tencor Corporation
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sub-pixel alignment of inspection to design
- Patent number 9,996,942
- Issue date Jun 12, 2018
- KLA-Tencor Corp.
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shape based grouping
- Patent number 9,965,848
- Issue date May 8, 2018
- KLA-Tencor Corporation
- Saibal Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Alignment of inspection to design using built in targets
- Patent number 9,830,421
- Issue date Nov 28, 2017
- KLA-Tencor Corp.
- Santosh Bhattacharyya
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Determining design coordinates for wafer defects
- Patent number 9,087,367
- Issue date Jul 21, 2015
- KLA-Tencor Corp.
- Ellis Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for generating a standard reference die for use in a die to...
- Patent number 8,204,296
- Issue date Jun 19, 2012
- KLA-Tencor Corp.
- Kris Bhaskar
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for creating persistent data for a wafer and fo...
- Patent number 8,126,255
- Issue date Feb 28, 2012
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for generating a standard reference die for use in a die to...
- Patent number 7,796,804
- Issue date Sep 14, 2010
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for detecting defects on a wafer and generating...
- Patent number 7,756,658
- Issue date Jul 13, 2010
- KLA-Tencor Corp.
- Ashok Kulkarni
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Methods, defect review tools, and systems for locating a defect in...
- Patent number 7,747,062
- Issue date Jun 29, 2010
- KLA-Tencor Technologies Corp.
- Da Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Outlier substrate inspection
- Patent number 7,440,607
- Issue date Oct 21, 2008
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
BBP Assisted Defect Detection Flow for SEM Images
- Publication number 20210133989
- Publication date May 6, 2021
- KLA Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Difference Filter and Aperture Selection Usin...
- Publication number 20200184628
- Publication date Jun 11, 2020
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G01 - MEASURING TESTING
Information Patent Application
DESIGN AND NOISE BASED CARE AREAS
- Publication number 20200126212
- Publication date Apr 23, 2020
- KLA-Tencor Corporation
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect-Location Determination Using Correction Loop for Pixel Align...
- Publication number 20200126830
- Publication date Apr 23, 2020
- KLA-Tencor Corporation
- David Dowling
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Discovery And Recipe Optimization For Inspection Of Three-Di...
- Publication number 20180149603
- Publication date May 31, 2018
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH SENSITIVITY REPEATER DEFECT DETECTION
- Publication number 20180130199
- Publication date May 10, 2018
- KLA-Tencor Corporation
- Bjorn Brauer
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR AUTOMATICALLY GENER...
- Publication number 20170352146
- Publication date Dec 7, 2017
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMBINED PATCH AND DESIGN-BASED DEFECT DETECTION
- Publication number 20170345142
- Publication date Nov 30, 2017
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT SENSITIVITY OF SEMICONDUCTOR WAFER INSPECTORS USING DESIGN D...
- Publication number 20170206650
- Publication date Jul 20, 2017
- KLA-Tencor Corporation
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPE BASED GROUPING
- Publication number 20170186151
- Publication date Jun 29, 2017
- KLA-Tencor Corporation
- Saibal Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sub-Pixel Alignment of Inspection to Design
- Publication number 20160275672
- Publication date Sep 22, 2016
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Alignment of Inspection to Design Using Built in Targets
- Publication number 20160188784
- Publication date Jun 30, 2016
- KLA-Tencor Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Determining Design Coordinates for Wafer Defects
- Publication number 20130064442
- Publication date Mar 14, 2013
- KLA-Tencor Corporation
- Ellis Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR GENERATING A STANDARD REFERENCE DIE FOR USE IN A DIE TO...
- Publication number 20100329540
- Publication date Dec 30, 2010
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER AND GENERATING...
- Publication number 20090287440
- Publication date Nov 19, 2009
- Ashok Kulkarni
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEMS AND METHODS FOR CREATING PERSISTENT DATA FOR A WAFER AND FO...
- Publication number 20090080759
- Publication date Mar 26, 2009
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR GENERATING A STANDARD REFERENCE DIE FOR USE IN A DIE TO...
- Publication number 20090041332
- Publication date Feb 12, 2009
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods, defect review tools, and systems for locating a defect in...
- Publication number 20080032429
- Publication date Feb 7, 2008
- Da Chen
- G06 - COMPUTING CALCULATING COUNTING

Santosh Bhattacharyya

Person

Patents Grantslast 30 patents

BBP assisted defect detection flow for SEM images

System and method for difference filter and aperture selection usin...

Defect-location determination using correction loop for pixel align...

Defect discovery and recipe optimization for inspection of three-di...

And noise based care areas

High sensitivity repeater defect detection

System, method and computer program product for automatically gener...

Combined patch and design-based defect detection

Inspection for specimens with extensive die to die process variation

Defect sensitivity of semiconductor wafer inspectors using design d...

Sub-pixel alignment of inspection to design

Shape based grouping

Alignment of inspection to design using built in targets

Determining design coordinates for wafer defects

Methods for generating a standard reference die for use in a die to...

Systems and methods for creating persistent data for a wafer and fo...

Methods for generating a standard reference die for use in a die to...

Systems and methods for detecting defects on a wafer and generating...

Methods, defect review tools, and systems for locating a defect in...

Outlier substrate inspection

Patents Applicationslast 30 patents

BBP Assisted Defect Detection Flow for SEM Images

System and Method for Difference Filter and Aperture Selection Usin...

DESIGN AND NOISE BASED CARE AREAS

Defect-Location Determination Using Correction Loop for Pixel Align...

Defect Discovery And Recipe Optimization For Inspection Of Three-Di...

HIGH SENSITIVITY REPEATER DEFECT DETECTION

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR AUTOMATICALLY GENER...

COMBINED PATCH AND DESIGN-BASED DEFECT DETECTION

DEFECT SENSITIVITY OF SEMICONDUCTOR WAFER INSPECTORS USING DESIGN D...

SHAPE BASED GROUPING

Sub-Pixel Alignment of Inspection to Design

Alignment of Inspection to Design Using Built in Targets

Determining Design Coordinates for Wafer Defects

METHODS FOR GENERATING A STANDARD REFERENCE DIE FOR USE IN A DIE TO...

SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER AND GENERATING...

SYSTEMS AND METHODS FOR CREATING PERSISTENT DATA FOR A WAFER AND FO...

METHODS FOR GENERATING A STANDARD REFERENCE DIE FOR USE IN A DIE TO...

Methods, defect review tools, and systems for locating a defect in...