Santosh Kulkarni

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Bangalore, IN

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Patents Grantslast 30 patents

Information Patent Grant
Command coverage analyzer
- Patent number 10,445,225
- Issue date Oct 15, 2019
- Synopsys, Inc.
- Chandramouli Gopalakrishnan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Command coverage analyzer
- Patent number 9,342,439
- Issue date May 17, 2016
- Synopsys, Inc.
- Chandramouli Gopalakrishnan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hierarchical testing architecture using core circuit with pseudo-in...
- Patent number 9,239,897
- Issue date Jan 19, 2016
- Synopsys, Inc.
- Subramanian B. Chebiyam
- G01 - MEASURING TESTING
Information Patent Grant
Test design optimizer for configurable scan architectures
- Patent number 8,954,918
- Issue date Feb 10, 2015
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Test design optimizer for configurable scan architectures
- Patent number 8,584,073
- Issue date Nov 12, 2013
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMMAND COVERAGE ANALYZER
- Publication number 20180107587
- Publication date Apr 19, 2018
- Synopsys, Inc.
- Chandramouli Gopalakrishnan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMMAND COVERAGE ANALYZER
- Publication number 20150363295
- Publication date Dec 17, 2015
- Synopsys, Inc.
- Chandramouli Gopalakrishnan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Hierarchical Testing Architecture Using Core Circuit with Pseudo-In...
- Publication number 20140304672
- Publication date Oct 9, 2014
- Subramanian B. Chebiyam
- G01 - MEASURING TESTING
Information Patent Application
TEST DESIGN OPTIMIZER FOR CONFIGURABLE SCAN ARCHITECTURES
- Publication number 20140059399
- Publication date Feb 27, 2014
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
TEST DESIGN OPTIMIZER FOR CONFIGURABLE SCAN ARCHITECTURES
- Publication number 20100017760
- Publication date Jan 21, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING