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Saori CHIDA
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Automatic analyzer
Patent number
11,041,874
Issue date
Jun 22, 2021
HITACHI HIGH-TECH CORPORATION
Saori Chida
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyser and method
Patent number
10,690,690
Issue date
Jun 23, 2020
HITACHI HIGH-TECH CORPORATION
Akihiro Yasui
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SAMPLE CONVEYING DEVICE AND SAMPLE CONVEYANCE METHOD
Publication number
20240103029
Publication date
Mar 28, 2024
HITACHI HIGH-TECH CORPORATION
Saori CHIDA
G01 - MEASURING TESTING
Information
Patent Application
Automatic Analysis System
Publication number
20230123687
Publication date
Apr 20, 2023
Hitachi High-Tech Corporation
Shigeru YANO
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20200096529
Publication date
Mar 26, 2020
Hitachi High-Technologies Corporation
Saori CHIDA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYSER AND METHOD
Publication number
20180120340
Publication date
May 3, 2018
Hitachi High-Technologies Corporation
Akihiro YASUI
G01 - MEASURING TESTING