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SARABJIT SINGH
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HYDERABAD, IN
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Patents Grants
last 30 patents
Information
Patent Grant
Enhancing RTD measurement accuracy by means of variable excitation...
Patent number
11,566,948
Issue date
Jan 31, 2023
Honeywell International Inc.
Eduardo Gallestey Alvarez
G01 - MEASURING TESTING
Information
Patent Grant
Detection of loop resistance and leakage current in input/output (I...
Patent number
11,002,766
Issue date
May 11, 2021
Honeywell International Inc.
Supriya Rawat
G01 - MEASURING TESTING
Information
Patent Grant
System and apparatus for sustaining process temperature measurement...
Patent number
10,310,462
Issue date
Jun 4, 2019
Honeywell International Inc.
Chaitanya Kumar Beeram
G01 - MEASURING TESTING
Information
Patent Grant
Level finding using multiple search steps
Patent number
10,180,342
Issue date
Jan 15, 2019
Honeywell International Inc.
Johan Backstrom
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
ENHANCING RTD MEASUREMENT ACCURACY BY MEANS OF VARIABLE EXCITATION...
Publication number
20210255046
Publication date
Aug 19, 2021
HONEYWELL INTERNATIONAL INC.
Eduardo Gallestey Alvarez
G01 - MEASURING TESTING
Information
Patent Application
DETECTION OF LOOP RESISTANCE AND LEAKAGE CURRENT IN INPUT/OUTPUT (I...
Publication number
20200271694
Publication date
Aug 27, 2020
HONEYWELL INTERNATIONAL INC.
Supriya Rawat
G01 - MEASURING TESTING
Information
Patent Application
LOCAL HART PROXY SERVER FOR MODULAR SMART TRANSMITTER DEVICES
Publication number
20180013857
Publication date
Jan 11, 2018
Honeywell International, Inc.
Augustene Manohar Shyam Pasala
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SYSTEM AND APPARATUS FOR SUSTAINING PROCESS TEMPERATURE MEASUREMENT...
Publication number
20170322089
Publication date
Nov 9, 2017
HONEYWELL INTERNATIONAL INC.
Chaitanya Kumar Beeram
G01 - MEASURING TESTING
Information
Patent Application
LEVEL FINDING USING MULTIPLE SEARCH STEPS
Publication number
20160097669
Publication date
Apr 7, 2016
Honeywell International Inc.
JOHAN BACKSTROM
G01 - MEASURING TESTING