Sarosh Patel

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
On-center electrically conductive pins for integrated testing
- Patent number 10,401,386
- Issue date Sep 3, 2019
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Grant
On-center electrically conductive pins for integrated testing
- Patent number 9,638,714
- Issue date May 2, 2017
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Thermal management for microcircuit testing system
- Patent number 9,476,936
- Issue date Oct 25, 2016
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Grant
On-center electrically conductive pins for integrated testing
- Patent number 9,429,591
- Issue date Aug 30, 2016
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Grant
On-center electrically conductive pins for integrated testing
- Patent number 9,341,649
- Issue date May 17, 2016
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Articulating contact pin
- Patent number D749526
- Issue date Feb 16, 2016
- Johnstech International Corporation
- David Johnson
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Articulating contact pin
- Patent number D749525
- Issue date Feb 16, 2016
- Johnstech International Corporation
- David Johnson
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Articulating contact pin
- Patent number D727269
- Issue date Apr 21, 2015
- Johnstech International Corporation
- David Johnson
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Articulating contact pin
- Patent number D719923
- Issue date Dec 23, 2014
- Johnstech International Corporation
- David Johnson
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Articulating contact pin
- Patent number D711836
- Issue date Aug 26, 2014
- Johnstech International Corporation
- David Johnson
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
High fidelity electrical probe
- Patent number 6,940,298
- Issue date Sep 6, 2005
- Teradyne, Inc.
- Theodore A. Gutfeldt
- G01 - MEASURING TESTING
Information Patent Grant
Manipulator apparatus with low-cost compliance
- Patent number 6,722,215
- Issue date Apr 20, 2004
- Michael Caradonna
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
On-Center Electrically Conductive Pins For Integrated Testing
- Publication number 20160370406
- Publication date Dec 22, 2016
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Application
On-Center Electrically Conductive Pins For Integrated Testing
- Publication number 20150015293
- Publication date Jan 15, 2015
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Application
High fidelity electrical probe
- Publication number 20040063229
- Publication date Apr 1, 2004
- Theodore A. Gutfeldt
- G01 - MEASURING TESTING
Information Patent Application
Manipulator apparatus with low-cost compliance
- Publication number 20030230155
- Publication date Dec 18, 2003
- Michael Caradonna
- G01 - MEASURING TESTING

Sarosh Patel

Person

Patents Grantslast 30 patents

On-center electrically conductive pins for integrated testing

On-center electrically conductive pins for integrated testing

Thermal management for microcircuit testing system

On-center electrically conductive pins for integrated testing

On-center electrically conductive pins for integrated testing

Articulating contact pin

Articulating contact pin

Articulating contact pin

Articulating contact pin

Articulating contact pin

High fidelity electrical probe

Manipulator apparatus with low-cost compliance

Patents Applicationslast 30 patents

On-Center Electrically Conductive Pins For Integrated Testing

On-Center Electrically Conductive Pins For Integrated Testing

High fidelity electrical probe

Manipulator apparatus with low-cost compliance