Satoko NAKAGAWA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Calibration curve determination method, carbon concentration measur...
- Patent number 10,330,599
- Issue date Jun 25, 2019
- Globalwafers Japan Co., Ltd
- Satoko Nakagawa
- G01 - MEASURING TESTING
Information Patent Grant
Calibration curve formation method, impurity concentration measurem...
- Patent number 9,541,452
- Issue date Jan 10, 2017
- GlobalWafers Japan Co., Ltd.
- Satoko Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CALIBRATION CURVE DETERMINATION METHOD, CARBON CONCENTRATION MEASUR...
- Publication number 20180231468
- Publication date Aug 16, 2018
- GLOBALWAFERS JAPAN CO., LTD.
- Satoko NAKAGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALIBRATION CURVE FORMATION METHOD, IMPURITY CONCENTRATION MEASUREM...
- Publication number 20150338276
- Publication date Nov 26, 2015
- GLOBALWAFERS JAPAN CO., LTD.
- Satoko NAKAGAWA
- G01 - MEASURING TESTING
Information Patent Application
SILICON SINGLE CRYSTAL AND METHOD FOR MANUFACTURE THEREOF
- Publication number 20150017086
- Publication date Jan 15, 2015
- GlobalWafers Japan Co., Ltd.
- Yuta NAGAI
- C30 - CRYSTAL GROWTH