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Satoru Fukunaga
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Osaka-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Method of thinning semiconductor wafer capable of preventing its fr...
Patent number
6,984,586
Issue date
Jan 10, 2006
Sharp Kabushiki Kaisha
Noriki Iwasaki
B24 - GRINDING POLISHING
Information
Patent Grant
Method of thinning semiconductor wafer capable of preventing its fr...
Patent number
6,520,844
Issue date
Feb 18, 2003
Sharp Kabushiki Kaisha
Noriki Iwasaki
B24 - GRINDING POLISHING
Information
Patent Grant
Jig used for assembling semiconductor devices
Patent number
6,423,102
Issue date
Jul 23, 2002
Sharp Kabushiki Kaisha
Satoru Fukunaga
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Testing apparatus for semiconductor device formed on tape carrier
Patent number
5,412,314
Issue date
May 2, 1995
Sharp Kabushiki Kaisha
Satoru Fukunaga
G01 - MEASURING TESTING
Information
Patent Grant
Burn-in apparatus and method of use thereof
Patent number
5,247,248
Issue date
Sep 21, 1993
Sharp Kabushiki Kaisha
Satoru Fukunaga
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method of thinning semiconductor wafer capable of preventing its fr...
Publication number
20030082915
Publication date
May 1, 2003
Sharp Kabushiki Kaisha
Noriki Iwasaki
B24 - GRINDING POLISHING
Information
Patent Application
Method of thinning semiconductor wafer capable of preventing its fr...
Publication number
20020016135
Publication date
Feb 7, 2002
Noriki Iwasaki
B24 - GRINDING POLISHING