Satoru ISHIGURO

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Itabashi-ku, Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Nondestructive testing system and nondestructive testing method
- Patent number 11,614,415
- Issue date Mar 28, 2023
- Topcon Corporation
- Shigenori Nagano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NON-DESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION SY...
- Publication number 20240272102
- Publication date Aug 15, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTION SYSTEM
- Publication number 20240192153
- Publication date Jun 13, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING DEVICE
- Publication number 20240183801
- Publication date Jun 6, 2024
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE TESTING SYSTEM AND NONDESTRUCTIVE TESTING METHOD
- Publication number 20220082514
- Publication date Mar 17, 2022
- TOPCON CORPORATION
- Shigenori NAGANO
- G01 - MEASURING TESTING