Satoru Iwama

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for inspecting and measuring sample and scanning electron mi...
- Patent number 8,481,934
- Issue date Jul 9, 2013
- Hitachi High-Technologies Corporation
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting and measuring sample and scanning electron mi...
- Patent number 7,960,696
- Issue date Jun 14, 2011
- Hitachi High-Technologies Corporation
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Observation method with electron beam
- Patent number 7,723,681
- Issue date May 25, 2010
- Hitachi High-Technologies Corporation
- Yuki Ojima
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 7,375,329
- Issue date May 20, 2008
- Hitachi High-Technologies Corporation
- Masashi Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 6,995,370
- Issue date Feb 7, 2006
- Hitachi High-Technologies Corporation
- Masashi Fujita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR INSPECTING AND MEASURING SAMPLE AND SCANNING ELECTRON MI...
- Publication number 20140001359
- Publication date Jan 2, 2014
- Hitachi High-Technologies Corporation
- Makoto EZUMI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING AND MEASURING SAMPLE AND SCANNING ELECTRON MI...
- Publication number 20110215243
- Publication date Sep 8, 2011
- Hitachi High-Technologies Corporation
- Makoto EZUMI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING AND MEASURING SAMPLE AND SCANNING ELECTRON MI...
- Publication number 20090084954
- Publication date Apr 2, 2009
- Hitachi High-Technologies Corporation
- Makoto EZUMI
- G01 - MEASURING TESTING
Information Patent Application
Observation Method With Electron Beam
- Publication number 20080265160
- Publication date Oct 30, 2008
- Hitachi High-Technologies Corporation
- Yuki OJIMA
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope
- Publication number 20060108527
- Publication date May 25, 2006
- Hitachi High-Technologies Corporation
- Masashi Fujita
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope
- Publication number 20050145791
- Publication date Jul 7, 2005
- Masashi Fujita
- G01 - MEASURING TESTING