Satoru Nagumo

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring optical characteristics and reco...
- Patent number 6,433,865
- Issue date Aug 13, 2002
- Advantest Corporation
- Eiji Kimura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for measuring optical characteristics and reco...
- Publication number 20020044274
- Publication date Apr 18, 2002
- Eiji Kimura
- G01 - MEASURING TESTING