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Satoru Niimura
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Surface shape measurement apparatus, surface shape measurement meth...
Patent number
7,206,080
Issue date
Apr 17, 2007
Topcon Corporation
Nobuo Kochi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Light wave range finder
Patent number
4,986,653
Issue date
Jan 22, 1991
Kabushiki Kaisha Topcon
Takashi Yokokura
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for finding range
Patent number
4,973,153
Issue date
Nov 27, 1990
Kabushiki Kaisha Topcon
Takashi Yokokura
G01 - MEASURING TESTING
Information
Patent Grant
Integrated-photocircuit interferometer
Patent number
4,941,744
Issue date
Jul 17, 1990
Tokyo Kogaku Kikai Kabushiki Kaisha
Takashi Yokokura
G01 - MEASURING TESTING
Information
Patent Grant
Light interferometer
Patent number
4,909,629
Issue date
Mar 20, 1990
Kabushiki Kaisha Topcon
Takashi Yokokura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Surface shape measurement apparatus, surface shape measurement meth...
Publication number
20040234122
Publication date
Nov 25, 2004
Nobuo Kochi
G06 - COMPUTING CALCULATING COUNTING