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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 10,134,785
- Issue date Nov 20, 2018
- SHARP KABUSHIKI KAISHA
- Naoki Makita
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 9,985,055
- Issue date May 29, 2018
- SHARP KABUSHIKI KAISHA
- Naoki Makita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid crystal display device and/or circuit substrate including bu...
- Patent number 7,005,741
- Issue date Feb 28, 2006
- Sharp Kabushiki Kaisha
- Atsushi Ono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with bumps on electrode pads oriented in given...
- Patent number 6,933,607
- Issue date Aug 23, 2005
- Sharp Kabushiki Kaisha
- Atsushi Ono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including bump electrodes
- Patent number 6,525,422
- Issue date Feb 25, 2003
- Sharp Kabushiki Kaisha
- Atsushi Ono
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20170033133
- Publication date Feb 2, 2017
- Sharp Kabushiki Kaisha
- Naoki MAKITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20160247831
- Publication date Aug 25, 2016
- Naoki MAKITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACTIVE MATRIX SUBSTRATE
- Publication number 20130082272
- Publication date Apr 4, 2013
- Sharp Kabushiki Kaisha
- Isao Nakanishi
- G02 - OPTICS
Information Patent Application
Semiconductor device and manufacturing method and testing method of...
- Publication number 20030067072
- Publication date Apr 10, 2003
- Sharp Kabushiki Kaisha
- Atsushi Ono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method and testing method of...
- Publication number 20030062623
- Publication date Apr 3, 2003
- Sharp Kabushiki Kaisha
- Atsushi Ono
- H01 - BASIC ELECTRIC ELEMENTS