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Saitama-shi, JP
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last 30 patents
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Patent Grant
Deformation measuring method and apparatus using electronic speckle...
Patent number
6,943,870
Issue date
Sep 13, 2005
President of Saitama University
Satoru Toyooka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Deformation measuring method and apparatus using electronic speckle...
Publication number
20040059526
Publication date
Mar 25, 2004
President of Saitama University
Satoru Toyooka
G01 - MEASURING TESTING
Information
Patent Application
Deformation measuring method and apparatus using electronic speckle...
Publication number
20040057054
Publication date
Mar 25, 2004
President of Saitama University
Satoru Toyooka
G01 - MEASURING TESTING
Information
Patent Application
Imaging spectral device
Publication number
20010052977
Publication date
Dec 20, 2001
SAITAMA UNIVERSITY
Satoru Toyooka
G01 - MEASURING TESTING