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Kyoto-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Analysis assistance device, method, and program for searching for a...
Patent number
12,339,262
Issue date
Jun 24, 2025
Shimadzu Corporation
Satoru Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Validation device, validation method and non-transitory computer re...
Patent number
12,313,640
Issue date
May 27, 2025
Shimadzu Corporation
Satoru Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Sample measurement device and measurement sample identification method
Patent number
12,306,150
Issue date
May 20, 2025
Shimadzu Corporation
Satoru Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Automatic suitability determination system
Patent number
12,085,580
Issue date
Sep 10, 2024
Shimadzu Corporation
Satoru Watanabe
G07 - CHECKING-DEVICES
Information
Patent Grant
Chromatographic control device, chromatographic system, chromatogra...
Patent number
12,085,543
Issue date
Sep 10, 2024
Shimadzu Corporation
Satoru Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Chromatograph and sample injection apparatus
Patent number
11,913,917
Issue date
Feb 27, 2024
Shimadzu Corporation
Satoru Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Analysis assistance device, analysis assistance method and non-tran...
Patent number
11,829,357
Issue date
Nov 28, 2023
Shimadzu Corporation
Satoru Watanabe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Liquid chromatograph and dissolution test system
Patent number
11,543,392
Issue date
Jan 3, 2023
Shimadzu Corporation
Taichi Tomono
G01 - MEASURING TESTING
Information
Patent Grant
Method of measuring accuracy of concentration in sending liquid in...
Patent number
11,486,863
Issue date
Nov 1, 2022
Shimadzu Corporation
Satoru Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Liquid chromatograph and dissolution test system
Patent number
11,243,191
Issue date
Feb 8, 2022
Shimadzu Corporation
Taichi Tomono
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SETTING METHOD AND SETTING DEVICE
Publication number
20250067709
Publication date
Feb 27, 2025
Shimadzu Corporation
Tomohiro KAWASE
G01 - MEASURING TESTING
Information
Patent Application
VALIDATION DEVICE, VALIDATION METHOD AND VALIDATION PROGRAM
Publication number
20250020678
Publication date
Jan 16, 2025
Shimadzu Corporation
Satoru WATANABE
G01 - MEASURING TESTING
Information
Patent Application
DATA PROCESSING SYSTEM FOR CHROMATOGRAPH
Publication number
20220412929
Publication date
Dec 29, 2022
Shimadzu Corporation
Satoru WATANABE
G01 - MEASURING TESTING
Information
Patent Application
LIQUID CHROMATOGRAPH
Publication number
20220260536
Publication date
Aug 18, 2022
Shimadzu Corporation
Satoru WATANABE
G01 - MEASURING TESTING
Information
Patent Application
Sample Measurement Device and Measurement Sample Identification Method
Publication number
20220155270
Publication date
May 19, 2022
Shimadzu Corporation
Satoru WATANABE
G01 - MEASURING TESTING
Information
Patent Application
LIQUID CHROMATOGRAPH AND DISSOLUTION TEST SYSTEM
Publication number
20220082533
Publication date
Mar 17, 2022
Shimadzu Corporation
Taichi TOMONO
G01 - MEASURING TESTING
Information
Patent Application
CHROMATOGRAPHIC CONTROL DEVICE, CHROMATOGRAPHIC SYSTEM, CHROMATOGRA...
Publication number
20220003722
Publication date
Jan 6, 2022
Shimadzu Corporation
Satoru WATANABE
G01 - MEASURING TESTING
Information
Patent Application
CHROMATOGRAPHIC CONTROL DEVICE, CHROMATOGRAPHIC SYSTEM, CHROMATOGRA...
Publication number
20210382020
Publication date
Dec 9, 2021
Shimadzu Corporation
Satoru WATANABE
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS ASSISTANCE DEVICE, ANALYSIS ASSISTANCE METHOD AND NON-TRAN...
Publication number
20210356446
Publication date
Nov 18, 2021
Shimadzu Corporation
Satoru WATANABE
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC SUITABILITY DETERMINATION SYSTEM
Publication number
20210349113
Publication date
Nov 11, 2021
Shimadzu Corporation
Satoru WATANABE
G01 - MEASURING TESTING
Information
Patent Application
VALIDATION DEVICE, VALIDATION METHOD AND VALIDATION PROGRAM
Publication number
20210349115
Publication date
Nov 11, 2021
Shimadzu Corporation
Satoru WATANABE
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS ASSISTANCE DEVICE, ANALYSIS ASSISTANCE METHOD AND NON-TRAN...
Publication number
20210341441
Publication date
Nov 4, 2021
Shimadzu Corporation
Satoru WATANABE
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS ASSISTANCE DEVICE, ANALYSIS ASSISTANCE METHOD AND NON-TRAN...
Publication number
20210334271
Publication date
Oct 28, 2021
Shimadzu Corporation
Satoru WATANABE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
VALIDATION DEVICE, VALIDATION METHOD AND VALIDATION PROGRAM
Publication number
20210318343
Publication date
Oct 14, 2021
Shimadzu Corporation
Satoru WATANABE
G01 - MEASURING TESTING
Information
Patent Application
CHROMATOGRAPH AND SAMPLE INJECTION APPARATUS
Publication number
20210285919
Publication date
Sep 16, 2021
Shimadzu Corporation
Satoru WATANABE
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MEASURING ACCURACY OF CONCENTRATION IN SENDING LIQUID IN...
Publication number
20210231622
Publication date
Jul 29, 2021
Shimadzu Corporation
Satoru WATANABE
G01 - MEASURING TESTING
Information
Patent Application
LIQUID CHROMATOGRAPH AND DISSOLUTION TEST SYSTEM
Publication number
20200150099
Publication date
May 14, 2020
Taichi TOMONO
G01 - MEASURING TESTING
Information
Patent Application
ANALYZER CONTROLLING APPARATUS
Publication number
20140040323
Publication date
Feb 6, 2014
Shimadzu Corporation
Takashi NAKAO
G01 - MEASURING TESTING