Satoru YAMAGUCHI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement system, method for generating learning model to be used...
- Patent number 12,198,327
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Ryou Yumiba
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam observation device, electron beam observation system,...
- Patent number 11,791,130
- Issue date Oct 17, 2023
- HITACHI HIGH-TECH CORPORATION
- Koichi Hamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,670,481
- Issue date Jun 6, 2023
- HITACHI HIGH-TECH CORPORATION
- Motonobu Hommi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,626,266
- Issue date Apr 11, 2023
- HITACHI HIGH-TECH CORPORATION
- Keiichiro Hitomi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measurement device and non-transitory computer readable med...
- Patent number 11,177,112
- Issue date Nov 16, 2021
- HITACHI HIGH-TECH CORPORATION
- Satoru Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam observation device, electron beam observation system,...
- Patent number 11,170,969
- Issue date Nov 9, 2021
- HITACHI HIGH-TECH CORPORATION
- Koichi Hamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device and image processing method
- Patent number 11,011,346
- Issue date May 18, 2021
- HITACHI HIGH-TECH CORPORATION
- Koichi Hamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device for imaging vias inside trenches
- Patent number 10,984,980
- Issue date Apr 20, 2021
- HITACHI HIGH-TECH CORPORATION
- Kei Sakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image-forming device, and dimension measurement device
- Patent number 10,976,536
- Issue date Apr 13, 2021
- HITACHI HIGH-TECH CORPORATION
- Yasunori Takasugi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display device
- Patent number 10,874,019
- Issue date Dec 22, 2020
- Japan Display Inc.
- Satoru Yamaguchi
- G02 - OPTICS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,665,420
- Issue date May 26, 2020
- Hitachi High-Technologies Corporation
- Yasunori Takasugi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image-forming device, and dimension measurement device
- Patent number 10,620,421
- Issue date Apr 14, 2020
- Hitachi High-Technologies Corporation
- Yasunori Takasugi
- G01 - MEASURING TESTING
Information Patent Grant
Overlay error measuring device and computer program for causing com...
- Patent number 10,545,017
- Issue date Jan 28, 2020
- Hitachi High-Technologies Corporation
- Satoru Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measurement device, and computer program for measuring pattern
- Patent number 10,545,018
- Issue date Jan 28, 2020
- Hitachi High-Technologies Corporation
- Satoru Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measurement apparatus and defect inspection apparatus
- Patent number 10,417,756
- Issue date Sep 17, 2019
- Hitachi High-Technologies Corporation
- Kei Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image-forming device, and dimension measurement device
- Patent number 10,197,783
- Issue date Feb 5, 2019
- Hitachi High-Technologies Corporation
- Yasunori Takasugi
- G02 - OPTICS
Information Patent Grant
Method for pattern measurement, method for setting device parameter...
- Patent number 9,831,062
- Issue date Nov 28, 2017
- Hitachi High-Technologies Corporation
- Makoto Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measurement device and computer program for evaluating patt...
- Patent number 9,804,107
- Issue date Oct 31, 2017
- Hitachi High-Technologies Corporation
- Akiyuki Sugiyama
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Liquid crystal display device, electronic apparatus, and method of...
- Patent number 9,581,845
- Issue date Feb 28, 2017
- Japan Display Inc.
- Yuichi Tsubaki
- G02 - OPTICS
Information Patent Grant
Semiconductor circuit pattern measuring apparatus and method
- Patent number 9,336,587
- Issue date May 10, 2016
- Hitachi High-Technologies Corporation
- Takuma Shibahara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern determination device and computer program
- Patent number 9,329,034
- Issue date May 3, 2016
- Hitachi High-Technologies Corporation
- Hitoshi Namai
- G01 - MEASURING TESTING
Information Patent Grant
Display device and electronic apparatus
- Patent number 9,119,287
- Issue date Aug 25, 2015
- Japan Display Inc.
- Yuichi Tsubaki
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Pattern measuring apparatus and computer program
- Patent number 9,000,365
- Issue date Apr 7, 2015
- Hitachi High-Technologies Corporation
- Yuzuru Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Edge detection technique and charged particle radiation equipment
- Patent number 8,953,855
- Issue date Feb 10, 2015
- Hitachi High-Technologies Corporation
- Hitoshi Namai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vehicle body structure for automobile
- Patent number 8,844,971
- Issue date Sep 30, 2014
- Honda Motor Co., Ltd.
- Hirofumi Tanaka
- B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information Patent Grant
Scanning electron microscope
- Patent number 8,666,165
- Issue date Mar 4, 2014
- Hitachi, Ltd.
- Satoru Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Vehicle body structure for automobile
- Patent number 8,608,238
- Issue date Dec 17, 2013
- Honda Motor Co., Ltd.
- Hirofumi Tanaka
- B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information Patent Grant
Vehicle body structure for automobile
- Patent number 8,434,816
- Issue date May 7, 2013
- Honda Motor Co., Ltd.
- Hirofumi Tanaka
- B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,263,935
- Issue date Sep 11, 2012
- Hitachi High-Technologies Corporation
- Atsushi Takane
- G01 - MEASURING TESTING
Information Patent Grant
Pattern search method
- Patent number 7,941,008
- Issue date May 10, 2011
- Hitachi High-Technologies Corporation
- Norio Satou
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Processing System and Charged Particle Beam Apparatus
- Publication number 20230314128
- Publication date Oct 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Masaya GOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System
- Publication number 20230317406
- Publication date Oct 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuto KAWASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measurement System, Method for Generating Learning Model to Be Used...
- Publication number 20220277434
- Publication date Sep 1, 2022
- Hitachi High-Tech Corporation
- Ryou YUMIBA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20220165537
- Publication date May 26, 2022
- HITACHI HIGH-TECH CORPORATION
- Motonobu HOMMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220130638
- Publication date Apr 28, 2022
- HITACHI HIGH-TECH CORPORATION
- Keiichiro HITOMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Observation Device, Electron Beam Observation System,...
- Publication number 20220051868
- Publication date Feb 17, 2022
- Hitachi High-Tech Corporation
- Koichi HAMADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM OBSERVATION DEVICE, ELECTRON BEAM OBSERVATION SYSTEM,...
- Publication number 20210125806
- Publication date Apr 29, 2021
- Hitachi High-Technologies Corporation
- Koichi HAMADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Measurement Device and Non-Transitory Computer Readable Med...
- Publication number 20200411281
- Publication date Dec 31, 2020
- Hitachi High-Tech Corporation
- Satoru YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM DEVICE AND IMAGE PROCESSING METHOD
- Publication number 20200303159
- Publication date Sep 24, 2020
- Hitachi High-Technologies Corporation
- Koichi HAMADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Image-Forming Device, and Dimension Measurement Device
- Publication number 20200201019
- Publication date Jun 25, 2020
- Hitachi High-Technologies Corporation
- Yasunori TAKASUGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISPLAY DEVICE
- Publication number 20200100362
- Publication date Mar 26, 2020
- Japan Display Inc.
- Satoru YAMAGUCHI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20190295815
- Publication date Sep 26, 2019
- Hitachi High-Technologies Corporation
- Yasunori TAKASUGI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Image-Forming Device, and Dimension Measurement Device
- Publication number 20190121113
- Publication date Apr 25, 2019
- Hitachi High-Technologies Corporation
- Yasunori TAKASUGI
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20190035600
- Publication date Jan 31, 2019
- Hitachi High-Technologies Corporation
- Kei SAKAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Measurement Apparatus and Flaw Inspection Apparatus
- Publication number 20180012349
- Publication date Jan 11, 2018
- Hitachi High-Technologies Corporation
- Kei SAKAI
- G01 - MEASURING TESTING
Information Patent Application
Pattern Measurement Device, and Computer Program for Measuring Pattern
- Publication number 20160320182
- Publication date Nov 3, 2016
- Hitachi High-Technologies Corporation
- Satoru YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Pattern Measurement Device and Computer Program
- Publication number 20160313266
- Publication date Oct 27, 2016
- Hitachi High-Technologies Corporation
- Akiyuki SUGIYAMA
- G01 - MEASURING TESTING
Information Patent Application
Method for Pattern Measurement, Method for Setting Device Parameter...
- Publication number 20150357158
- Publication date Dec 10, 2015
- Hitachi High-Technologies Corporation
- Makoto SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OVERLAY ERROR MEASURING DEVICE AND COMPUTER PROGRAM FOR CAUSING COM...
- Publication number 20150285627
- Publication date Oct 8, 2015
- Hitachi High-Technologies Corporation
- Satoru Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Image-Forming Device, and Dimension Measurement Device
- Publication number 20150002652
- Publication date Jan 1, 2015
- Hitachi High-Technologies Corporation
- Yasunori Takasugi
- G02 - OPTICS
Information Patent Application
DISPLAY DEVICE AND ELECTRONIC APPARATUS
- Publication number 20140240961
- Publication date Aug 28, 2014
- Japan Display Inc.
- Yuichi TSUBAKI
- B60 - VEHICLES IN GENERAL
Information Patent Application
LIQUID CRYSTAL DISPLAY DEVICE, ELECTRONIC APPARATUS, AND METHOD OF...
- Publication number 20140232969
- Publication date Aug 21, 2014
- Japan Display Inc.
- Yuichi TSUBAKI
- G02 - OPTICS
Information Patent Application
SEMICONDUCTOR CIRCUIT PATTERN MEASURING APPARATUS AND METHOD
- Publication number 20140003703
- Publication date Jan 2, 2014
- Hitachi High-Technologies Corporation
- Takuma SHIBAHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN DETERMINATION DEVICE AND COMPUTER PROGRAM
- Publication number 20130270436
- Publication date Oct 17, 2013
- Hitachi High-Technologies Corporation
- Hitoshi Namai
- G01 - MEASURING TESTING
Information Patent Application
VEHICLE BODY STRUCTURE FOR AUTOMOBILE
- Publication number 20130033072
- Publication date Feb 7, 2013
- Honda Motor Co., Ltd.
- Hirofumi Tanaka
- B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information Patent Application
VEHICLE BODY STRUCTURE FOR AUTOMOBILE
- Publication number 20130026746
- Publication date Jan 31, 2013
- Honda Motor Co., Ltd.
- Hirofumi Tanaka
- B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information Patent Application
VEHICLE BODY STRUCTURE FOR AUTOMOBILE
- Publication number 20130026792
- Publication date Jan 31, 2013
- Honda Motor Co., Ltd.
- Hirofumi Tanaka
- B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information Patent Application
PATTERN MEASURING APPARATUS AND COMPUTER PROGRAM
- Publication number 20120037801
- Publication date Feb 16, 2012
- Yuzuru Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20100102224
- Publication date Apr 29, 2010
- Hitachi High-Technologies Corporation
- Atsushi TAKANE
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM ALIGNMENT METHOD AND CHARGED PARTICLE BEAM AP...
- Publication number 20100006755
- Publication date Jan 14, 2010
- Mitsugo Sato
- H01 - BASIC ELECTRIC ELEMENTS

Satoru YAMAGUCHI

Person

Patents Grantslast 30 patents

Measurement system, method for generating learning model to be used...

Electron beam observation device, electron beam observation system,...

Charged particle beam device

Charged particle beam device

Pattern measurement device and non-transitory computer readable med...

Electron beam observation device, electron beam observation system,...

Electron beam device and image processing method

Charged particle beam device for imaging vias inside trenches

Image-forming device, and dimension measurement device

Display device

Charged particle beam apparatus

Image-forming device, and dimension measurement device

Overlay error measuring device and computer program for causing com...

Pattern measurement device, and computer program for measuring pattern

Pattern measurement apparatus and defect inspection apparatus

Image-forming device, and dimension measurement device

Method for pattern measurement, method for setting device parameter...

Pattern measurement device and computer program for evaluating patt...

Liquid crystal display device, electronic apparatus, and method of...

Semiconductor circuit pattern measuring apparatus and method

Pattern determination device and computer program

Display device and electronic apparatus

Pattern measuring apparatus and computer program

Edge detection technique and charged particle radiation equipment

Vehicle body structure for automobile

Scanning electron microscope

Vehicle body structure for automobile

Vehicle body structure for automobile

Charged particle beam apparatus

Pattern search method

Patents Applicationslast 30 patents

Processing System and Charged Particle Beam Apparatus

Charged Particle Beam System

Measurement System, Method for Generating Learning Model to Be Used...

Charged Particle Beam Device

CHARGED PARTICLE BEAM DEVICE

Electron Beam Observation Device, Electron Beam Observation System,...

ELECTRON BEAM OBSERVATION DEVICE, ELECTRON BEAM OBSERVATION SYSTEM,...

Pattern Measurement Device and Non-Transitory Computer Readable Med...

ELECTRON BEAM DEVICE AND IMAGE PROCESSING METHOD

Image-Forming Device, and Dimension Measurement Device

DISPLAY DEVICE

Charged Particle Beam Apparatus

Image-Forming Device, and Dimension Measurement Device

Charged Particle Beam Device

Pattern Measurement Apparatus and Flaw Inspection Apparatus

Pattern Measurement Device, and Computer Program for Measuring Pattern

Pattern Measurement Device and Computer Program

Method for Pattern Measurement, Method for Setting Device Parameter...

OVERLAY ERROR MEASURING DEVICE AND COMPUTER PROGRAM FOR CAUSING COM...

Image-Forming Device, and Dimension Measurement Device

DISPLAY DEVICE AND ELECTRONIC APPARATUS

LIQUID CRYSTAL DISPLAY DEVICE, ELECTRONIC APPARATUS, AND METHOD OF...

SEMICONDUCTOR CIRCUIT PATTERN MEASURING APPARATUS AND METHOD

PATTERN DETERMINATION DEVICE AND COMPUTER PROGRAM

VEHICLE BODY STRUCTURE FOR AUTOMOBILE

VEHICLE BODY STRUCTURE FOR AUTOMOBILE

VEHICLE BODY STRUCTURE FOR AUTOMOBILE

PATTERN MEASURING APPARATUS AND COMPUTER PROGRAM

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM ALIGNMENT METHOD AND CHARGED PARTICLE BEAM AP...