Satoshi Akutagawa

Person

Akiruno, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection method, pattern inspection system and pattern in...
- Patent number 7,466,405
- Issue date Dec 16, 2008
- Fujitsu Limited
- Satoshi Akutagawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of and device for detecting pattern, method of and device fo...
- Patent number 6,807,654
- Issue date Oct 19, 2004
- Fujitsu Limited
- Satoshi Akutagawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Plate pattern forming method and its inspecting method
- Patent number 6,413,688
- Issue date Jul 2, 2002
- Fujitsu Limited
- Satoshi Akutagawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parallel graphic processing system using a network
- Patent number 6,008,822
- Issue date Dec 28, 1999
- Shinko Electric Industries, Co., Ltd.
- Masahiro Yumoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parallel graphic processing system using a network
- Patent number 5,936,642
- Issue date Aug 10, 1999
- Shinko Electric Industries, Co., Ltd.
- Masahiro Yumoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Graphic processing apparatus
- Patent number 5,889,531
- Issue date Mar 30, 1999
- Shinko Electric Industries Co., Ltd.
- Kazuaki Koike
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for checking a mask pattern
- Patent number 5,287,290
- Issue date Feb 15, 1994
- Fujitsu Limited
- Katsuji Tabara
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Pattern inspection method, pattern inspection system and pattern in...
- Publication number 20050220332
- Publication date Oct 6, 2005
- FUJITSU LIMITED
- Satoshi Akutagawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of and device for detecting pattern, method of and device fo...
- Publication number 20030018943
- Publication date Jan 23, 2003
- FUJITSU LIMITED
- Satoshi Akutagawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Plate pattern forming method and its inspecting method
- Publication number 20020006562
- Publication date Jan 17, 2002
- Satoshi Akutagawa
- G01 - MEASURING TESTING

Satoshi Akutagawa

Person

Patents Grantslast 30 patents

Pattern inspection method, pattern inspection system and pattern in...

Method of and device for detecting pattern, method of and device fo...

Plate pattern forming method and its inspecting method

Parallel graphic processing system using a network

Parallel graphic processing system using a network

Graphic processing apparatus

Method and apparatus for checking a mask pattern

Patents Applicationslast 30 patents

Pattern inspection method, pattern inspection system and pattern in...

Method of and device for detecting pattern, method of and device fo...

Plate pattern forming method and its inspecting method