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Satoshi HIGUCHI
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Shiojiri-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Imaging device, inspection apparatus, and method of manufacturing e...
Patent number
9,929,205
Issue date
Mar 27, 2018
Seiko Epson Corporation
Takefumi Fukagawa
G02 - OPTICS
Information
Patent Grant
Imaging device, inspection apparatus, and method of manufacturing e...
Patent number
9,182,273
Issue date
Nov 10, 2015
Seiko Epson Corporation
Takefumi Fukagawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
IMAGING DEVICE, INSPECTION APPARATUS, AND METHOD OF MANUFACTURING E...
Publication number
20160020245
Publication date
Jan 21, 2016
SEIKO EPSON CORPORATION
Takefumi FUKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
IMAGING DEVICE, INSPECTION APPARATUS, AND METHOD OF MANUFACTURING E...
Publication number
20140061431
Publication date
Mar 6, 2014
SEIKO EPSON CORPORATION
Takefumi FUKAGAWA
G02 - OPTICS