Membership
Tour
Register
Log in
Satoshi Iguchi
Follow
Person
Kobe-shi, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Specimen analyzing method and specimen analyzing apparatus
Patent number
10,261,016
Issue date
Apr 16, 2019
Sysmex Corporation
Norimasa Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Specimen analyzing method and specimen analyzing apparatus
Patent number
9,316,583
Issue date
Apr 19, 2016
Sysmex Corporation
Norimasa Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Specimen analyzing method and specimen analyzing apparatus
Patent number
9,028,756
Issue date
May 12, 2015
Sysmex Corporation
Norimasa Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Specimen analyzing method and specimen analyzing apparatus
Patent number
8,545,760
Issue date
Oct 1, 2013
Sysmex Corporation
Norimasa Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Dispenser, reagent dispenser and sample analyzer
Patent number
7,850,921
Issue date
Dec 14, 2010
Sysmex Corporation
Satoshi Iguchi
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents
Information
Patent Application
SPECIMEN ANALYZING METHOD AND SPECIMEN ANALYZING APPARATUS
Publication number
20160195560
Publication date
Jul 7, 2016
SYSMEX CORPORATION
Norimasa YAMAMOTO
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN ANALYZING METHOD AND SPECIMEN ANALYZING APPARATUS
Publication number
20150211995
Publication date
Jul 30, 2015
SYSMEX CORPORATION
Norimasa YAMAMOTO
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN ANALYZING METHOD AND SPECIMEN ANALYZING APPARATUS
Publication number
20140004612
Publication date
Jan 2, 2014
SYSMEX CORPORATION
Norimasa Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
Dispenser, reagent dispenser and sample analyzer
Publication number
20080044311
Publication date
Feb 21, 2008
Sysmex Corporation
Satoshi Iguchi
G05 - CONTROLLING REGULATING
Information
Patent Application
Specimen analyzing method and specimen analyzing apparatus
Publication number
20080020481
Publication date
Jan 24, 2008
SYSMEX CORPORATION
Norimasa Yamamoto
G01 - MEASURING TESTING