Satoshi Iwamoto

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Magneto-optical material and production method therefor
- Patent number 12,099,263
- Issue date Sep 24, 2024
- Research Institute for Electromagnetic Materials
- Satoshi Iwamoto
- G02 - OPTICS
Information Patent Grant
Test apparatus
- Patent number 8,427,188
- Issue date Apr 23, 2013
- Advantest Corporation
- Satoshi Iwamoto
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus synchronous module and synchronous method
- Patent number 8,405,415
- Issue date Mar 26, 2013
- Advantest Corporation
- Satoshi Iwamoto
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus additional module and test method
- Patent number 8,362,791
- Issue date Jan 29, 2013
- Advantest Corporation
- Motoo Ueda
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for testing device has synchronization module which...
- Patent number 8,261,119
- Issue date Sep 4, 2012
- Advantest Corporation
- Satoshi Iwamoto
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method
- Patent number 7,906,981
- Issue date Mar 15, 2011
- Advantest Corporation
- Satoshi Iwamoto
- G01 - MEASURING TESTING
Information Patent Grant
Test equipment
- Patent number 7,876,118
- Issue date Jan 25, 2011
- Advantest Corporation
- Satoshi Iwamoto
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic program, a switching program, a testing apparatus, and a...
- Patent number 7,802,140
- Issue date Sep 21, 2010
- Advantest Corporation
- Satoshi Iwamoto
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and performance board for diagnosis
- Patent number 7,610,538
- Issue date Oct 27, 2009
- Advantest Corporation
- Satoshi Iwamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Recording medium, test apparatus and diagnostic method
- Patent number 7,552,028
- Issue date Jun 23, 2009
- Advantest Corporation
- Satoshi Iwamoto
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus, measuring method, testing apparatus, testing m...
- Patent number 7,398,169
- Issue date Jul 8, 2008
- Advantest Corporation
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus, diagnosing program and diagnosing method therefor
- Patent number 7,158,908
- Issue date Jan 2, 2007
- Advantest Corporation
- Satoshi Iwamoto
- G01 - MEASURING TESTING
Information Patent Grant
Radiation-sensitive resin composition
- Patent number 7,141,355
- Issue date Nov 28, 2006
- JSR Corporation
- Shin-ichiro Iwanaga
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Driver circuit with temperature correction circuit
- Patent number 6,094,085
- Issue date Jul 25, 2000
- Advantest Corp.
- Toshiyuki Okayasu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Driver circuit with temperature correction circuit
- Patent number 5,973,542
- Issue date Oct 26, 1999
- Advantest Corp.
- Toshiyuki Okayasu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MAGNETO-OPTICAL MATERIAL AND PRODUCTION METHOD THEREFOR
- Publication number 20230273465
- Publication date Aug 31, 2023
- RESEARCH INSTITUTE FOR ELECTROMAGNETIC MATERIALS
- Satoshi IWAMOTO
- G02 - OPTICS
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20110060933
- Publication date Mar 10, 2011
- Advantest Corporation
- Satoshi IWAMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS SYNCHRONOUS MODULE AND SYNCHRONOUS METHOD
- Publication number 20110057663
- Publication date Mar 10, 2011
- Advantest Corporation
- Satoshi IWAMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20110057673
- Publication date Mar 10, 2011
- Advantest Corporation
- Satoshi IWAMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS
- Publication number 20110012612
- Publication date Jan 20, 2011
- Advantest Corporation
- Satoshi IWAMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEST EQUIPMENT AND TEST METHOD
- Publication number 20100194421
- Publication date Aug 5, 2010
- Advantest Corporation
- SATOSHI IWAMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS ADDITIONAL MODULE AND TEST METHOD
- Publication number 20100102840
- Publication date Apr 29, 2010
- Advantest Corporation
- Motoo UEDA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND PERFORMANCE BOARD FOR DIAGNOSIS
- Publication number 20080256408
- Publication date Oct 16, 2008
- Advantest Corporation
- Satoshi Iwamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS AND DEVICE INTERFACE
- Publication number 20080133165
- Publication date Jun 5, 2008
- Advantest Corporation
- SATOSHI IWAMOTO
- G01 - MEASURING TESTING
Information Patent Application
Recording medium, test apparatus and diagnostic method
- Publication number 20080129313
- Publication date Jun 5, 2008
- Advantest Corporation
- Satoshi Iwamoto
- G01 - MEASURING TESTING
Information Patent Application
Measuring apparatus, measuring method, testing apparatus, testing m...
- Publication number 20070203659
- Publication date Aug 30, 2007
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus, diagnosing program and diagnosing method therefor
- Publication number 20060259264
- Publication date Nov 16, 2006
- Advantest Corporation
- Satoshi Iwamoto
- G01 - MEASURING TESTING
Information Patent Application
Diagnostic program, a switching program, a testing apparatus, and a...
- Publication number 20060224926
- Publication date Oct 5, 2006
- Advantest Corporation
- Satoshi Iwamoto
- G01 - MEASURING TESTING
Information Patent Application
Radiation-sensitive resin composition
- Publication number 20040142280
- Publication date Jul 22, 2004
- Shin-ichiro Iwanaga
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Satoshi Iwamoto

Person

Patents Grantslast 30 patents

Magneto-optical material and production method therefor

Test apparatus

Test apparatus synchronous module and synchronous method

Test apparatus additional module and test method

Test apparatus for testing device has synchronization module which...

Test apparatus and test method

Test equipment

Diagnostic program, a switching program, a testing apparatus, and a...

Test apparatus and performance board for diagnosis

Recording medium, test apparatus and diagnostic method

Measuring apparatus, measuring method, testing apparatus, testing m...

Test apparatus, diagnosing program and diagnosing method therefor

Radiation-sensitive resin composition

Driver circuit with temperature correction circuit

Driver circuit with temperature correction circuit

Patents Applicationslast 30 patents

MAGNETO-OPTICAL MATERIAL AND PRODUCTION METHOD THEREFOR

TEST APPARATUS AND TEST METHOD

TEST APPARATUS SYNCHRONOUS MODULE AND SYNCHRONOUS METHOD

TEST APPARATUS AND TEST METHOD

TEST APPARATUS

TEST EQUIPMENT AND TEST METHOD

TEST APPARATUS ADDITIONAL MODULE AND TEST METHOD

TEST APPARATUS AND PERFORMANCE BOARD FOR DIAGNOSIS

TEST APPARATUS AND DEVICE INTERFACE

Recording medium, test apparatus and diagnostic method

Measuring apparatus, measuring method, testing apparatus, testing m...

Test apparatus, diagnosing program and diagnosing method therefor

Diagnostic program, a switching program, a testing apparatus, and a...

Radiation-sensitive resin composition