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Satoshi Koga

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  • Tsukuba, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Defect judging unit of measuring probe and defect judging method th...
    • Patent number 11,268,874
    • Issue date Mar 8, 2022
    • Mitutoyo Corporation
    • Akinori Saito
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe unit and measuring system
    • Patent number 11,047,678
    • Issue date Jun 29, 2021
    • Mitutoyo Corporation
    • Satoshi Koga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Coordinate measurement probe body
    • Patent number 10,852,119
    • Issue date Dec 1, 2020
    • Mitutoyo Corporation
    • Scott Allen Harsila
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring probe
    • Patent number 10,415,949
    • Issue date Sep 17, 2019
    • Mitutoyo Corporation
    • Satoshi Koga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring probe
    • Patent number 10,393,495
    • Issue date Aug 27, 2019
    • Mitutoyo Corporation
    • Satoshi Koga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe microscope
    • Patent number 8,314,940
    • Issue date Nov 20, 2012
    • Mitutoyo Corporation
    • Yoshimasa Suzuki
    • B82 - NANO-TECHNOLOGY
  • Information Patent Grant

    Probe microscope
    • Patent number 8,108,942
    • Issue date Jan 31, 2012
    • Mitutoyo Corporation
    • Yoshimasa Suzuki
    • B82 - NANO-TECHNOLOGY
  • Information Patent Grant

    Shape measuring apparatus
    • Patent number 7,907,288
    • Issue date Mar 15, 2011
    • Mitutoyo Corporation
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring apparatus
    • Patent number 7,681,439
    • Issue date Mar 23, 2010
    • Mitutoyo Corporation
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Reseat system of touch signal probe
    • Patent number 6,678,966
    • Issue date Jan 20, 2004
    • Mitutoyo Corporation
    • Satoshi Koga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Reseat system for touch probe in coordinates measuring machine
    • Patent number 6,523,273
    • Issue date Feb 25, 2003
    • Mitutoyo Corporation
    • Nobuhisa Nishioki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Micrometer
    • Patent number 6,178,658
    • Issue date Jan 30, 2001
    • Mitutoyo Corporation
    • Satoshi Koga
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    DEFECT JUDGING UNIT OF MEASURING PROBE AND DEFECT JUDGING METHOD TH...
    • Publication number 20200386646
    • Publication date Dec 10, 2020
    • MITUTOYO CORPORATION
    • Akinori SAITO
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE UNIT AND MEASURING SYSTEM
    • Publication number 20200166336
    • Publication date May 28, 2020
    • MITUTOYO CORPORATION
    • Satoshi KOGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    COORDINATE MEASUREMENT PROBE BODY
    • Publication number 20190120606
    • Publication date Apr 25, 2019
    • MITUTOYO CORPORATION
    • Scott Allen Harsila
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASURING PROBE
    • Publication number 20170248400
    • Publication date Aug 31, 2017
    • MITUTOYO CORPORATION
    • Satoshi KOGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASURING PROBE
    • Publication number 20170248402
    • Publication date Aug 31, 2017
    • MITUTOYO CORPORATION
    • Satoshi KOGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE MICROSCOPE
    • Publication number 20110007324
    • Publication date Jan 13, 2011
    • Mitutoyo Corporation
    • Yoshimasa Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE MICROSCOPE
    • Publication number 20100199393
    • Publication date Aug 5, 2010
    • Mitutoyo Corporation
    • Yoshimasa Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Shape measuring apparatus
    • Publication number 20090021747
    • Publication date Jan 22, 2009
    • Mitutoyo Corporation
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Measuring apparatus
    • Publication number 20080047335
    • Publication date Feb 28, 2008
    • Mitutoyo Corporation
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING