Membership
Tour
Register
Log in
Satoshi Mitsuyama
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Automatic analyzer for identifying a cause of abnormalities of meas...
Patent number
10,352,864
Issue date
Jul 16, 2019
Hitachi High-Technologies Corporation
Kumiko Kamihara
G01 - MEASURING TESTING
Information
Patent Grant
Method of transmitting control data for system conversion among liq...
Patent number
10,281,439
Issue date
May 7, 2019
Hitachi High-Technologies Corporation
Toshimichi Aota
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analysis device and automatic analysis method
Patent number
10,203,277
Issue date
Feb 12, 2019
Hitachi High-Technologies Corporation
Chihiro Manri
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analysis device and automatic analysis program
Patent number
9,562,917
Issue date
Feb 7, 2017
Hitachi High-Technologies Corporation
Chihiro Manri
G01 - MEASURING TESTING
Information
Patent Grant
Automated analyzer and automated analysis method
Patent number
9,494,525
Issue date
Nov 15, 2016
Hitachi High-Technologies Corporation
Shinji Tarumi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automatic analyzer
Patent number
9,488,667
Issue date
Nov 8, 2016
Hitachi High-Technologies Corporation
Kumiko Kamihara
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analysis device and analysis method
Patent number
9,476,893
Issue date
Oct 25, 2016
Hitachi High-Technologies Corporation
Satoshi Mitsuyama
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer and analysis method
Patent number
9,310,388
Issue date
Apr 12, 2016
Hitachi High-Technologies Corporation
Kumiko Kamihara
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for dividing area of image of particle in urine
Patent number
9,239,281
Issue date
Jan 19, 2016
Hitachi High-Technologies Corporation
Chihiro Manri
G01 - MEASURING TESTING
Information
Patent Grant
Method for assisting judgment of abnormality of reaction process da...
Patent number
9,217,712
Issue date
Dec 22, 2015
Hitachi High-Technologies Corporation
Satoshi Mitsuyama
G01 - MEASURING TESTING
Information
Patent Grant
Analytical apparatus and analytical method
Patent number
9,110,019
Issue date
Aug 18, 2015
Hitachi High-Technologies Corporation
Satoshi Mitsuyama
G01 - MEASURING TESTING
Information
Patent Grant
Flow type particle image analysis method and device
Patent number
8,831,306
Issue date
Sep 9, 2014
Hitachi High-Technologies Corporation
Chihiro Manri
G01 - MEASURING TESTING
Information
Patent Grant
Nucleic acid base sequence determining method and inspecting system
Patent number
7,660,676
Issue date
Feb 9, 2010
Hitachi, Ltd.
Satoshi Hirata
G01 - MEASURING TESTING
Information
Patent Grant
Bacteriological examination system
Patent number
7,054,756
Issue date
May 30, 2006
Hitachi, Ltd.
Kazuyuki Shimada
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pattern recognition apparatus and pattern recognition method
Patent number
6,549,661
Issue date
Apr 15, 2003
Hitachi, Ltd.
Satoshi Mitsuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pattern recognition system
Patent number
5,911,002
Issue date
Jun 8, 1999
Hitachi, Ltd.
Satoshi Mitsuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Region segmentation method for particle images and apparatus thereof
Patent number
5,768,412
Issue date
Jun 16, 1998
Hitachi, Ltd.
Satoshi Mitsuyama
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
DATA INTEGRATION EVALUATION SYSTEM AND DATA INTEGRATION EVALUATION...
Publication number
20220050853
Publication date
Feb 17, 2022
Hitachi, Ltd
Tomoaki KAKEDA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DATA MANAGEMENT METHOD, DATA MANAGEMENT SYSTEM AND PROGRAM
Publication number
20210397598
Publication date
Dec 23, 2021
Hitachi, Ltd
Kouhei FUKUMOTO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF TRANSMITTING CONTROL DATA FOR SYSTEM CONVERSION AMONG LIQ...
Publication number
20160216239
Publication date
Jul 28, 2016
Hitachi High-Technologies Corporation
Toshimichi AOTA
G01 - MEASURING TESTING
Information
Patent Application
Automated Analyzer and Automated Analysis Method
Publication number
20150316531
Publication date
Nov 5, 2015
Hitachi High-Technologies Corporation
Shinji TARUMI
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS PROGRAM
Publication number
20140136123
Publication date
May 15, 2014
Hitachi High-Technologies Corporation
Chihiro Manri
G01 - MEASURING TESTING
Information
Patent Application
Medical Care Support System
Publication number
20130317847
Publication date
Nov 28, 2013
Hitachi, Ltd
Shuntaro Yui
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AUTOMATIC ANALYZER, ANALYSIS METHOD, AND INFORMATION PROCESSOR
Publication number
20130122596
Publication date
May 16, 2013
Hitachi High-Technologies Corporation
Kumiko Kamihara
G01 - MEASURING TESTING
Information
Patent Application
Analytical Apparatus and Analytical Method
Publication number
20130107256
Publication date
May 2, 2013
Hitachi High-Technologies Corporation
Satoshi Mitsuyama
G01 - MEASURING TESTING
Information
Patent Application
Medical Care Support System and Method Of Supporting Medical Care
Publication number
20130103417
Publication date
Apr 25, 2013
Hitachi, Ltd
Kumiko Seto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
Publication number
20130046480
Publication date
Feb 21, 2013
Chihiro Manri
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE IMAGE ANALYSIS APPARATUS
Publication number
20120134559
Publication date
May 31, 2012
Hitachi High-Technologies Corporation
Akiko Suzuki
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER AND ANALYSIS METHOD
Publication number
20120109534
Publication date
May 3, 2012
Hitachi High-Technologies Corporation
Kumiko Kamihara
G01 - MEASURING TESTING
Information
Patent Application
FLOW TYPE PARTICLE IMAGE ANALYSIS METHOD AND DEVICE
Publication number
20120076349
Publication date
Mar 29, 2012
Hitachi High-Technologies Corporation
Chihiro Manri
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20120065898
Publication date
Mar 15, 2012
Hitachi High-Technologies Corporation
Kumiko Kamihara
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYSIS DEVICE AND ANALYSIS METHOD
Publication number
20120064636
Publication date
Mar 15, 2012
Hitachi High-Technologies Corporation
Satoshi Mitsuyama
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ASSISTING JUDGMENT OF ABNORMALITY OF REACTION PROCESS DA...
Publication number
20110125415
Publication date
May 26, 2011
Satoshi Mitsuyama
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR DIVIDING AREA OF IMAGE OF PARTICLE IN URINE
Publication number
20110002516
Publication date
Jan 6, 2011
Chihiro Manri
G01 - MEASURING TESTING
Information
Patent Application
Data analysis system and data analysis method
Publication number
20060282222
Publication date
Dec 14, 2006
Satoshi Mitsuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Diagnostic decision support system and method of diagnostic decisio...
Publication number
20050216208
Publication date
Sep 29, 2005
Akira Saito
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Nucleic acid base sequence determining method and inspecting system
Publication number
20040110137
Publication date
Jun 10, 2004
Satoshi Hirata
G01 - MEASURING TESTING
Information
Patent Application
System and method for medical data analysis
Publication number
20040111433
Publication date
Jun 10, 2004
Kumiko Seto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method of extracting item patterns across a plurality of databases,...
Publication number
20030236785
Publication date
Dec 25, 2003
Takahiko Shintani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Bacteriological examination system
Publication number
20020164676
Publication date
Nov 7, 2002
Hitachi, Ltd.
Kazuyuki Shimada
G01 - MEASURING TESTING