Satoshi Morishita

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device having a test circuit
- Patent number 11,605,419
- Issue date Mar 14, 2023
- Micron Technology, Inc.
- Satoshi Morishita
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device equipped with global column redundancy
- Patent number 11,574,699
- Issue date Feb 7, 2023
- Micron Technology, Inc.
- Satoshi Morishita
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE HAVING A TEST CIRCUIT
- Publication number 20230005520
- Publication date Jan 5, 2023
- Micron Technology, Inc.
- Satoshi Morishita
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE EQUIPPED WITH GLOBAL COLUMN REDUNDANCY
- Publication number 20230005565
- Publication date Jan 5, 2023
- Micron Technology, Inc.
- Satoshi Morishita
- G11 - INFORMATION STORAGE