Satoshi Murakami

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Patents Grantslast 30 patents

Information Patent Grant
X-ray analysis system, x-ray analysis device, and vapor phase decom...
- Patent number 10,989,678
- Issue date Apr 27, 2021
- Rigaku Corporation
- Hiroshi Kono
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometer
- Patent number 10,598,616
- Issue date Mar 24, 2020
- Rigaku Corporation
- Satoshi Murakami
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY ANALYSIS SYSTEM, X-RAY ANALYSIS DEVICE, AND VAPOR PHASE DECOM...
- Publication number 20200408706
- Publication date Dec 31, 2020
- Rigaku Corporation
- Hiroshi KONO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY REFLECTOMETER
- Publication number 20190277781
- Publication date Sep 12, 2019
- Rigaku Corporation
- Satoshi Murakami
- G01 - MEASURING TESTING