Satoshi Nishii

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for multi-level rounding and pattern inspection
- Patent number 6,504,947
- Issue date Jan 7, 2003
- NEC Corporation
- Takeo Nozaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reference image forming method and pattern inspection apparatus
- Patent number 6,040,911
- Issue date Mar 21, 2000
- NEC Corporation
- Takeo Nozaki
- G01 - MEASURING TESTING