Satoshi Notoya

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray analyzer using electron beam
- Patent number 7,592,591
- Issue date Sep 22, 2009
- Jeol Ltd.
- Satoshi Notoya
- G01 - MEASURING TESTING
Information Patent Grant
Electron probe microanalyzer
- Patent number 6,118,123
- Issue date Sep 12, 2000
- Jeol Ltd.
- Satoshi Notoya
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
X-ray analyzer using electron beam
- Publication number 20080067379
- Publication date Mar 20, 2008
- JEOL Ltd.
- Satoshi Notoya
- G01 - MEASURING TESTING