Satoshi Ohashi

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Radiation detection system and signal processor for radiation detec...
- Patent number 10,795,031
- Issue date Oct 6, 2020
- Horiba, Ltd.
- Satoshi Ohashi
- G01 - MEASURING TESTING
Information Patent Grant
Radiolucent window, radiation detector and radiation detection appa...
- Patent number 10,147,511
- Issue date Dec 4, 2018
- Horiba, Ltd.
- Satoshi Ohashi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Radiolucent window, radiation detector and radiation detection appa...
- Patent number 9,666,323
- Issue date May 30, 2017
- Horiba, Ltd.
- Satoshi Ohashi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray analyzer
- Patent number 9,250,201
- Issue date Feb 2, 2016
- Horiba, Ltd.
- Satoshi Ohashi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer
- Patent number 9,170,220
- Issue date Oct 27, 2015
- Horiba, Ltd.
- Kentaro Nishikata
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic lens for charged particle radiation
- Patent number 8,669,534
- Issue date Mar 11, 2014
- Horiba, Ltd.
- Akira Onoguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample measuring device
- Patent number 7,589,322
- Issue date Sep 15, 2009
- Horiba, Ltd.
- Kentaro Nishikata
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
RADIATION DETECTION SYSTEM AND SIGNAL PROCESSOR FOR RADIATION DETEC...
- Publication number 20190154847
- Publication date May 23, 2019
- HORIBA, LTD.
- Satoshi OHASHI
- G01 - MEASURING TESTING
Information Patent Application
RADIOLUCENT WINDOW, RADIATION DETECTOR AND RADIATION DETECTION APPA...
- Publication number 20170229206
- Publication date Aug 10, 2017
- HORIBA, Ltd.
- Satoshi OHASHI
- G01 - MEASURING TESTING
Information Patent Application
RADIOLUCENT WINDOW, RADIATION DETECTOR AND RADIATION DETECTION APPA...
- Publication number 20150235726
- Publication date Aug 20, 2015
- HORIBA, Ltd.
- Satoshi OHASHI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20150083909
- Publication date Mar 26, 2015
- Horiba, Ltd.
- Satoshi Ohashi
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20140326881
- Publication date Nov 6, 2014
- Kentaro Nishikata
- G01 - MEASURING TESTING
Information Patent Application
ELECTROSTATIC LENS FOR CHARGED PARTICLE RADIATION
- Publication number 20130009070
- Publication date Jan 10, 2013
- HORIBA, LTD.
- Akira Onoguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample measuring device
- Publication number 20070023655
- Publication date Feb 1, 2007
- Kentaro Nishikata
- H01 - BASIC ELECTRIC ELEMENTS